The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12664767 B1

Date of Patent:

Jun. 23, 2026

Filed:

Aug. 18, 2023

Microscopy system and method for testing a sensitivity of an image processing model

Applicant:

Carl Zeiss Microscopy Gmbh, Jena, DE;

Inventors:

Manuel Amthor, Jena, DE;

Daniel Haase, Zoellnitz, DE;

Ralf Wolleschensky, Jena, DE;

Assignee:

Carl Zeiss Microscopy GmbH, Jena, DE;

Attorney:

LaBatt, LLC

Primary Examiner:

Ming Y Hon

Int. Cl.

CPC ...

G06V 10/776 (2022.01); G06V 10/70 (2022.01); G06V 10/774 (2022.01); G06V 20/69 (2022.01);

U.S. Cl.

CPC ...

G06V 10/776 (2022.01); G06V 10/768 (2022.01); G06V 10/774 (2022.01); G06V 20/695 (2022.01); G06V 20/698 (2022.01);

Abstract

A computer-implemented method tests a sensitivity of an image processing model trained using training data which includes microscope images. The training data is also used to form a generative model that can produce a generated microscope image from an input parameter set. The generative model is used to produce a series of generated microscope images by varying at least one parameter of the parameter set. An image processing result is calculated from each of the generated microscope images using the image processing model. A sensitivity of the image processing model to the at least one parameter is then ascertained based on differences between the image processing results.

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