The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 2026
Filed:
Dec. 16, 2022
Applicant:
Carl Zeiss Microscopy Gmbh, Jena, DE;
Inventors:
Horst Wolff, Siegsdorf, DE;
Rebecca Elsaesser, Jena, DE;
Assignee:
Carl Zeiss Microscopy GmbH, Jena, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 5/50 (2006.01); G02B 21/36 (2006.01); G06T 5/70 (2024.01); G06T 5/77 (2024.01);
U.S. Cl.
CPC ...
G06T 5/50 (2013.01); G02B 21/367 (2013.01); G06T 5/70 (2024.01); G06T 5/77 (2024.01); G06T 2207/10056 (2013.01); G06T 2207/20081 (2013.01);
Abstract
In a method for reducing an image vignetting, a microscope image is captured by means of a microscope, wherein the microscope image exhibits a vignetting. At least the microscope image is input into an image processing model which has been trained, by means of training data comprising input images with vignetting and associated target images without vignetting, to calculate a vignetting-free microscope image from at least the input microscope image. The method further comprises the outputting of a calculated vignetting-free microscope image by the image processing model.