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Taichung, Taiwan

Yun-Zong Tian

This inventor holds 12 USPTO granted patents and 7 published patent applications. Top assignee: Inotera Memories, Inc.. Active years: 2010-2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yun-Zong Tian. Retrieved from https://idiyas.com/inventor/yun-zong-tian

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 12 

% Patents Active = 91.7

Average Co-Inventor Count = 3.7

ph-index = 2

Forward Citations = 9(Granted Patents)


Location History:

  • Taichung County, TW (2010 - 2012)
  • Shihgang Township, Taichung County, TW (2011 - 2012)
  • Taichung, TW (2013 - 2014)

Company Filing History:

goldMedal12 out of 123 
 
Inotera Memories, Inc.
 patents

Years Active: 2010-2014

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12 patents (USPTO):Explore Patents
1. 8756028 - Fault detection method of semiconductor manufacturing processes and system architecture thereof (2014-06-17),
2. 8649990 - Method for detecting variance in semiconductor processes (2014-02-11),
3. 8510610 - Method and system of compressing raw fabrication data for fault determination (2013-08-13),
4. 8332416 - Specification establishing method for controlling semiconductor process (2012-12-11),
5. 8265903 - Method for assessing data worth for analyzing yield rate (2012-09-11),
6. 8244500 - Method of adjusting wafer processing sequence (2012-08-14),
7. 8195431 - Method for evaluating efficacy of prevention maintenance for a tool (2012-06-05),
8. 8170964 - Method for planning a semiconductor manufacturing process based on users' demands using a fuzzy system and a genetic algorithm model (2012-05-01),
9. 8090668 - Method for predicting cycle time (2012-01-03),
10. 8032248 - Method for finding the correlation between the tool PM and the product yield (2011-10-04),
11. 8010212 - Fuzzy control method for adjusting a semiconductor machine (2011-08-30),
12. 7855086 - Method for monitoring fabrication parameter (2010-12-21),

Title: Innovations by Yun-Zong Tian in Semiconductor Manufacturing

Introduction

Yun-Zong Tian is a prominent inventor based in Taichung, Taiwan. He has made significant contributions to the field of semiconductor manufacturing, holding a total of 12 patents. His work focuses on improving fault detection methods and enhancing the efficiency of semiconductor processes.

Latest Patents

One of his latest patents is a fault detection method of semiconductor manufacturing processes and the system architecture thereof. This method involves several steps, including providing a storage device, collecting fault detection and classification (FDC) parameters, and establishing relationships between various parameters to determine the situation of generating wafer defects. Another notable patent is a method for detecting variance in semiconductor processes. This method utilizes regression models and involves preparing FDC and wafer acceptance test (WAT) data for analysis, utilizing factor analysis, and demonstrating how tools and FDC data affect WAT data.

Career Highlights

Yun-Zong Tian is currently employed at Inotera Memories, Inc., where he continues to innovate in the semiconductor industry. His expertise in fault detection and process variance has positioned him as a valuable asset in his field.

Collaborations

He has collaborated with notable coworkers, including Chun Chi Chen and Yi Feng Lee, contributing to advancements in semiconductor technology.

Conclusion

Yun-Zong Tian's innovative work in semiconductor manufacturing has led to significant advancements in fault detection and process efficiency. His contributions are vital to the ongoing development of the semiconductor industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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