Wu-An Weng

USPTO Granted Patents = 12 (Patent Applications = 2)

Average Co-Inventor Count = 2.7

ph-index = 4

Forward Citations = 36(Granted Patents)

Company Filing History:

8 out of 40,635

Taiwan Semiconductor Manufacturing Comp. Ltd.

patents

4 out of 3,595

Macronix International Co., Ltd.

patents

Years Active: 1997-2024

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12 patents (USPTO):Sort by Forward Citations

Abstract keywords

1. 11961770 - Automated inspection tool (2024-04-16),

2. 11171065 - Automated inspection tool (2021-11-09),

3. 10490463 - Automated inspection tool (2019-11-26),

4. 9972771 - MRAM devices and methods of forming the same (2018-05-15),

5. 9472690 - Deep trench capacitor manufactured by streamlined process (2016-10-18),

6. 9012296 - Self-aligned deep trench capacitor, and method for making the same (2015-04-21),

7. 8853048 - Streamlined process for vertical semiconductor devices (2014-10-07),

8. 7795644 - Integrated circuits with stress memory effect and fabrication methods thereof (2010-09-14),

9. 7141179 - Monitoring semiconductor wafer defects below one nanometer (2006-11-28),

10. 7041565 - Method for fabricating a capacitor in a semiconductor device (2006-05-09),

11. 5691216 - Integrated circuit self-aligning process and apparatus (1997-11-25),

12. 5621697 - High density integrated circuit with bank select structure (1997-04-15),

Title: Wu-An Weng: Innovator in Automated Inspection Technology

Introduction

Wu-An Weng is a prominent inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of automated inspection tools, holding a total of 12 patents. His work focuses on enhancing the efficiency and accuracy of wafer processing in semiconductor manufacturing.

Latest Patents

One of Wu-An Weng's latest patents is an automated inspection tool designed for processing wafers. This innovative tool features a housing that encloses a processing chamber, along with an input/output port that allows wafers to pass through. Within the processing chamber, a back-side macro-inspection system is implemented to image the back side of the wafer. Additionally, a front-side macro-inspection system captures images of the front side at a first image resolution. To further enhance inspection capabilities, a front-side micro-inspection system is also included, which images the front side at a higher resolution than the macro system.

Career Highlights

Wu-An Weng has had a distinguished career, working with leading companies in the semiconductor industry. He has been associated with Taiwan Semiconductor Manufacturing Company Limited and Macronix International Co., Ltd. His experience in these organizations has allowed him to develop cutting-edge technologies that improve wafer inspection processes.

Collaborations

Throughout his career, Wu-An Weng has collaborated with notable colleagues, including Chen-Chien Chang and Chia-Han Lin. These partnerships have contributed to the advancement of innovative solutions in the field of semiconductor manufacturing.

Conclusion

Wu-An Weng's contributions to automated inspection technology have positioned him as a key figure in the semiconductor industry. His patents and collaborations reflect his commitment to innovation and excellence in wafer processing.

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