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For the Inventor, By the Inventor

Helmond, Netherlands

Wim Tjibbo Tel

This inventor holds 72 USPTO granted patents and 11 published patent applications and 6 EPO patents, primarily in Computational Metrology (CPC class G03F). Top assignee: Asml Netherlands B.v.. Active years: 2005-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Wim Tjibbo Tel. Retrieved from https://idiyas.com/inventor/wim-tjibbo-tel

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 72 

% Patents Active = 88.9

 

Average Co-Inventor Count = 4.1

ph-index = 8

Forward Citations = 236(Granted Patents)

Forward Citations (Not Self Cited) = 187(Dec 10, 2025)


Inventors with similar research interests:


Company Filing History:

goldMedal72 out of 5,075 
 
Asml Netherlands B.v.
 patents

Years Active: 2005-2026

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Areas of Expertise:
Field-Of-View Setting
Defect Detection
Measurement Locations
Wafer Alignment
Process Monitoring
Lithographic Apparatus
Calibration Methods
Control Parameters
Topographical Variation
Projection System Focus
Sampling Scheme
Patterning Device
72 patents (USPTO):Explore Patents
1. 12675051 - Method for characterizing a manufacturing process of semiconductor devices (2026-07-07),
2. 12566385 - Method for determining a field-of-view setting (2026-03-03),
3. 12461451 - Computational metrology (2025-11-04),
4. 12332573 - Method for determining defectiveness of pattern based on after development image (2025-06-17),
5. 12315175 - Method in the manufacturing process of a device, a non-transitory computer-readable medium and a system configured to perform the method (2025-05-27),
6. 12228862 - Selection of measurement locations for patterning processes (2025-02-18),
7. 12210293 - Method for determining a measurement recipe and associated apparatuses (2025-01-28),
8. 12197136 - Method of determining control parameters of a device manufacturing process (2025-01-14),
9. 12189302 - Computational metrology (2025-01-07),
10. 12124179 - Method of wafer alignment using at resolution metrology on product features (2024-10-22),
11. 12044980 - Method of manufacturing devices (2024-07-23),
12. 12044979 - Computational metrology based sampling scheme (2024-07-23),
13. 11972922 - Method for calibrating a scanning charged particle microscope (2024-04-30),
14. 11860548 - Method for characterizing a manufacturing process of semiconductor devices (2024-01-02),
15. 11822255 - Process window based on defect probability (2023-11-21),

Certainly! Here is the article about inventor Wim Tjibbo Tel:

Title: Wim Tjibbo Tel: Pioneering Innovator in Technology

Introduction:

Wim Tjibbo Tel, a visionary inventor hailing from Helmond, NL, has made significant strides in the world of technology with his relentless pursuit of innovation. His impressive portfolio of 62 patents speaks volumes about his unwavering dedication to pushing the boundaries of what is possible in the realm of technology.

Latest Patents:

Among his latest patents is a groundbreaking "Method of manufacturing devices," which revolutionizes the process analysis by utilizing multi-dimensional probability density functions. Additionally, his "Computational metrology based sampling scheme" showcases his prowess in optimizing metrology sampling schemes for patterning processes, leading to enhanced efficiency and precision in manufacturing.

Career Highlights:

Wim Tjibbo Tel's career is highlighted by his tenure at ASML Netherlands B.V., a prominent technology company at the forefront of the semiconductor industry. Through his innovative solutions and cutting-edge technologies, he has played a pivotal role in driving advancements in semiconductor manufacturing processes.

Collaborations:

Throughout his career, Wim Tjibbo Tel has collaborated closely with esteemed colleagues such as Frank Staals and Marinus Jochemsen. Together, they have worked tirelessly to bring forth novel ideas and inventive solutions that have shaped the landscape of technology.

Conclusion:

In conclusion, Wim Tjibbo Tel's remarkable contributions to the world of technology solidify his legacy as a visionary inventor. His innovative patents and collaborative efforts have not only propelled technological advancements but have also inspired future generations to continue pushing the boundaries of innovation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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