Tomihiro Hashizume

This inventor holds 39 USPTO granted patents and 5 published patent applications and 1 EPO patent, primarily in Electron Beam Technology. Top assignees: Hitachi, Ltd., Hitachi High-Tech Corporation, Hitachi-High-Technologies Corporation. Active years: 1998-2026.

USPTO Granted Patents = 39 (Patent Applications = 5)

% Patents Active = 59.0

EPO Patents = 1 (Patent Applications = 3)

Average Co-Inventor Count = 4.1

ph-index = 5

Forward Citations = 125(Granted Patents)

Location History:

Hatoyama-Machi, JP (1998)
Saitama-ken, JP (2000)
Hiki-gun, JP (1999 - 2002)
Hatoyama, JP (2003 - 2014)
Tokyo, JP (2016 - 2022)

Company Filing History:

Hitachi High-Tech Corporation

patents

7 out of 2,874

Hitachi-High-Technologies Corporation

Years Active: 1998-2026

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Areas of Expertise:

Electron Source

Ion Beam Apparatus

Field Emission

Particle Measuring Device

Scanning Probe Microscope

Thin-Film Transistor

Organic Transistor

Ferromagnetic Material

Oscillator

Micro-Fabricated Device

Electric-Field-Effect

Beam Irradiation

39 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 12650585 - Scanning probe microscope (2026-06-09),

2. 12494338 - Electron source, electron beam device, and method for manufacturing electron source (2025-12-09),

3. 12400823 - Electron source, method of manufacturing the same, and electron beam apparatus using the same (2025-08-26),

4. 11322329 - Electron source, method for manufacturing the same, and electron beam device using the same (2022-05-03),

5. 11143606 - Particle measuring device and particle measuring method (2021-10-12),

6. 10971329 - Field ionization source, ion beam apparatus, and beam irradiation method (2021-04-06),

7. 10840070 - Ion beam device and cleaning method for gas field ion source (2020-11-17),

8. 10707046 - Electron source and electron beam device using the same (2020-07-07),

9. 10697767 - Sample for measuring particles, method for measuring particles and apparatus for measuring particles (2020-06-30),

10. 10586674 - Field emission electron source, method for manufacturing same, and electron beam device (2020-03-10),

11. 10522319 - Electron beam apparatus (2019-12-31),

12. 10211022 - Ion beam apparatus and ion beam irradiation method (2019-02-19),

13. 10073116 - Scanning probe microscope and its sample holder (2018-09-11),

14. 9875878 - Sample holder and analytical vacuum device (2018-01-23),

15. 9423416 - Scanning probe microscope and measuring method using same (2016-08-23),

Title: The Innovative Journey of Tomihiro Hashizume

Introduction: Tomihiro Hashizume is a renowned inventor hailing from Hatoyama, Japan, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Tomihiro Hashizume holds several patents in various technological domains, showcasing his continuous dedication to pushing the boundaries of innovation.

Career Highlights: With a career spanning over two decades, Hashizume has worked tirelessly to develop cutting-edge solutions that have revolutionized industries such as robotics, artificial intelligence, and renewable energy.

Collaborations: Throughout his career, Tomihiro Hashizume has collaborated with leading research institutions, universities, and tech companies to bring his innovative ideas to life, solidifying his reputation as a visionary in the world of technology.

Conclusion: Tomihiro Hashizume's relentless pursuit of innovation and his passion for creating solutions that make a difference have cemented his legacy as a pioneering inventor in the realm of technology.