The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 2020
Filed:
Aug. 31, 2016
Sample for measuring particles, method for measuring particles and apparatus for measuring particles
Applicant:
Hitachi High-technologies Corporation, Tokyo, JP;
Inventors:
Assignee:
HITACHI HIGH-TECHNOLOGIES CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 15/08 (2006.01); G01N 23/225 (2018.01); G01N 15/02 (2006.01); G01N 15/06 (2006.01); G01B 15/00 (2006.01); G01Q 30/06 (2010.01);
U.S. Cl.
CPC ...
G01B 15/08 (2013.01); G01B 15/00 (2013.01); G01N 15/02 (2013.01); G01N 15/06 (2013.01); G01N 23/225 (2013.01); G01Q 30/06 (2013.01);
Abstract
To provide a sample for measuring particles enabling the three-dimensional particulate shape to be measured and the particulate species to be evaluated, the sample for measuring particles includes a substrate; isolated nanoparticles to be measured which are disposed on the substrate; and isolated standard nanoparticles which are disposed on the substrate in the vicinity of the isolated nanoparticles to be measured.