Tokyo, Japan

Sukehiro Ito

This inventor holds 33 USPTO granted patents and 1 published patent application and 1 EPO patent. Top assignees: Hitachi-High-Technologies Corporation, Hitachi-Science Systems, Ltd., Hitachi High-Tech Science Systems Corporation. Active years: 2006-2019.

USPTO Granted Patents = 33 

% Patents Active = 66.7


Average Co-Inventor Count = 3.4

ph-index = 5

Forward Citations = 74(Granted Patents)


Location History:

  • Hitachinaka, JP (2006 - 2017)
  • Tokyo, JP (2014 - 2019)

Company Filing History:


Years Active: 2006-2019

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Areas of Expertise:
Charged Particle Beam Device
Sample Observation Method
Observation System
Image Generation Method
Inspection Apparatus
Optical Axis Adjustment
Scanning Electron Microscope
Charged Particle Radiation Device
Specimen Observation
Electric Field Discharge-Type Electron Source
Sample Inspection Method
Inclined Observation Image Display
33 patents (USPTO):Explore Patents

Title: Innovations of Sukehiro Ito in Charged Particle Beam Technology

Introduction: Sukehiro Ito, based in Tokyo, Japan, is a remarkable inventor with a robust portfolio of 33 patents. His work has significantly contributed to advancements in charged particle beam devices, enhancing methods for observing samples with precision.

Latest Patents: Among his latest innovations are several notable patents, including a charged particle beam device, sample observation method, sample platform, observation system, and light-emitting member. The primary aim of these inventions is to simplify the placement and extraction of samples when conducting observations using transmitted charged particles. His charged particle beam device features a charged particle optical lens tube that irradiates samples with a primary charged particle beam, coupled with a sample stage that includes a light-emitting member. This light-emitting member detects light emitted as a result of charged particles transmitted through or scattered by the sample, facilitating enhanced observation capabilities. Additionally, his patents include an image generation method and an observation system that enables the inspection of both the surface and interior of samples using different charged particle modes.

Career Highlights: Sukehiro Ito has had a distinguished career, significantly impacting the field of charged particle technology. He has worked with prominent companies, including Hitachi High-Technologies Corporation and Hitachi Science Systems, Ltd., where he honed his expertise in advanced scientific instrumentation and observation techniques.

Collaborations: Throughout his career, Ito has collaborated with talented professionals, including Yusuke Ominami and Tomohisa Ohtaki. These collaborations have undoubtedly contributed to his achievements and innovations in the realm of charged particle beam technologies.

Conclusion: Sukehiro Ito's contributions to science and technology through his patents and collaborations are a testament to his innovative spirit. His inventions in charged particle beam devices not only improve the efficiency of sample observations but also pave the way for future advancements in the field. Through his work, he continues to inspire emerging inventors and researchers committed to pushing boundaries in scientific exploration.

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