Rosmalen, Netherlands

Simon Gijsbert Josephus Mathijssen

Average Co-Inventor Count = 3.8

ph-index = 5

Forward Citations = 101(Granted Patents)

Forward Citations (Not Self Cited) = 73(Sep 21, 2024)

DiyaCoin DiyaCoin 0.18 

Inventors with similar research interests:


Location History:

  • Den Bosch, NL (2016 - 2018)
  • Veldhoven, NL (2018 - 2021)
  • Rosmalen, NL (2017 - 2024)


Years Active: 2016-2025

where 'Filed Patents' based on already Granted Patents

57 patents (USPTO):

Title: Unveiling the Innovative Mind of Simon Gijsbert Josephus Mathijssen

Introduction: Simon Gijsbert Josephus Mathijssen, a brilliant inventor hailing from Rosmalen, Netherlands, has made significant contributions to the field of metrology with an impressive portfolio of 52 patents.

Latest Patents:

1. Metrology method and associated metrology and lithographic apparatuses: This patent introduces a groundbreaking metrology method for measuring structures on substrates with asymmetric deviations. It involves obtaining intensity asymmetry values, determining phase offset values, and deriving measurement corrections for accurate results.

2. Metrology method: Another innovative patent by Mathijssen focuses on receiving images from metrology tools, identifying accurate metrology values from individual units within the images, and discriminating units based on their similarities.

Career Highlights: Mathijssen has showcased his expertise while working at renowned companies such as ASML Netherlands B.V. and ASML Holding N.V. His innovative spirit and dedication to advancing metrology technologies have left a lasting impact on the industry.

Collaborations: Throughout his career, Mathijssen has collaborated with talented individuals in the field, including Arie Jeffrey Den Boef and Sander Bas Roobol. Together, they have developed cutting-edge solutions and pushed the boundaries of metrology innovation.

Conclusion: Simon Gijsbert Josephus Mathijssen stands as a testament to the power of innovation and ingenuity in shaping the future of metrology. His patents and collaborations have paved the way for advancements in precision measurement techniques, benefiting industries worldwide.

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