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For the Inventor, By the Inventor

Rosmalen, Netherlands

Simon Gijsbert Josephus Mathijssen

This inventor holds 61 USPTO granted patents and 8 published patent applications and 4 EPO patents, primarily in Metrology Techniques (CPC class G03F). Top assignees: Asml Netherlands B.v., Asml Holding N.v.. Active years: 2016-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Simon Gijsbert Josephus Mathijssen. Retrieved from https://idiyas.com/inventor/simon-gijsbert-josephus-mathijssen

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 61 

% Patents Active = 91.8

 

Average Co-Inventor Count = 3.7

ph-index = 5

Forward Citations = 121(Granted Patents)

Forward Citations (Not Self Cited) = 99(Dec 10, 2025)


Inventors with similar research interests:


Location History:

  • Den Bosch, NL (2016 - 2018)
  • Veldhoven, NL (2018 - 2021)
  • Rosmalen, NL (2017 - 2024)

Company Filing History:

goldMedal61 out of 5,070 
 
Asml Netherlands B.v.
 patents
silverMedal9 out of 629 
 
Asml Holding N.v.
 patents
where one patent can have more than one assignee

Years Active: 2016-2026

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Areas of Expertise:
Metrology Method
Lithographic Apparatus
Alignment Techniques
Inspection Apparatus
Patterning Devices
Position Sensor
Illumination Source
Target Structure
Measurement Performance
Gas Delivery Apparatus
Diffractive Optical System
Edge Detection
61 patents (USPTO):Explore Patents
1. 12724354 - Method for inferring a local uniformity metric (2026-09-01),
2. 12474647 - Generating an alignment signal based on local alignment mark distortions (2025-11-18),
3. 12474642 - Metrology method for measuring an etched trench and associated metrology apparatus (2025-11-18),
4. 12436470 - Substrate comprising a target arrangement, and associated at least one patterning device, lithographic method and metrology method (2025-10-07),
5. 12189314 - Metrology method and associated metrology and lithographic apparatuses (2025-01-07),
6. 12189305 - Metrology method and apparatus and computer program (2025-01-07),
7. 12158435 - Illumination and detection apparatus for a metrology apparatus (2024-12-03),
8. 12130246 - Method for overlay metrology and apparatus thereof (2024-10-29),
9. 12061421 - Method and system for determining information about a target structure (2024-08-13),
10. 12032299 - Metrology method and associated metrology and lithographic apparatuses (2024-07-09),
11. 12013647 - Metrology method (2024-06-18),
12. 11886125 - Method for inferring a local uniformity metric (2024-01-30),
13. 11391677 - Methods and apparatus for predicting performance of a measurement method, measurement method and apparatus (2022-07-19),
14. 11360399 - Metrology sensor for position metrology (2022-06-14),
15. 11300883 - Method to determine a patterning process parameter (2022-04-12),

Title: Unveiling the Innovative Mind of Simon Gijsbert Josephus Mathijssen

Introduction: Simon Gijsbert Josephus Mathijssen, a brilliant inventor hailing from Rosmalen, Netherlands, has made significant contributions to the field of metrology with an impressive portfolio of 52 patents.

Latest Patents:

1. Metrology method and associated metrology and lithographic apparatuses: This patent introduces a groundbreaking metrology method for measuring structures on substrates with asymmetric deviations. It involves obtaining intensity asymmetry values, determining phase offset values, and deriving measurement corrections for accurate results.

2. Metrology method: Another innovative patent by Mathijssen focuses on receiving images from metrology tools, identifying accurate metrology values from individual units within the images, and discriminating units based on their similarities.

Career Highlights: Mathijssen has showcased his expertise while working at renowned companies such as ASML Netherlands B.V. and ASML Holding N.V. His innovative spirit and dedication to advancing metrology technologies have left a lasting impact on the industry.

Collaborations: Throughout his career, Mathijssen has collaborated with talented individuals in the field, including Arie Jeffrey Den Boef and Sander Bas Roobol. Together, they have developed cutting-edge solutions and pushed the boundaries of metrology innovation.

Conclusion: Simon Gijsbert Josephus Mathijssen stands as a testament to the power of innovation and ingenuity in shaping the future of metrology. His patents and collaborations have paved the way for advancements in precision measurement techniques, benefiting industries worldwide.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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