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For the Inventor, By the Inventor

Warwick, NY, United States of America

Roger M Young

USPTO Granted Patents = 14

Average Co-Inventor Count = 4.3

ph-index = 3

Forward Citations = 29(Granted Patents)


Company Filing History:

goldMedal14 out of 164,108 
 
International Business Machines Corporation
 patents

Years Active: 2007-2017

where 'Filed Patents' based on already Granted Patents

14 patents (USPTO):
1. 9652729 - Metrology management (2017-05-16),
2. 8736275 - Alignment correction system and method of use (2014-05-27),
3. 8680871 - Alignment correction system and method of use (2014-03-25),
4. 8451008 - Alignment correction system and method of use (2013-05-28),
5. 8411270 - Monitoring stage alignment and related stage and calibration target (2013-04-02),
6. 7937177 - Manufacturing work in process management system (2011-05-03),
7. 7853345 - Offset determination method for measurement system matching (2010-12-14),
8. 7742160 - Determining angle of incidence with respect to workpiece (2010-06-22),
9. 7646491 - Determining azimuth angle of incident beam to wafer (2010-01-12),
10. 7592817 - Alignment correction system and method of use (2009-09-22),
11. 7542136 - Flipping stage arrangement for reduced wafer contamination cross section and improved measurement accuracy and throughput (2009-06-02),
12. 7477365 - Optical spot geometric parameter determination using calibration targets (2009-01-13),
13. 7318206 - Offset determination for measurement system matching (2008-01-08),
14. 7248936 - Automated tool recipe verification and correction (2007-07-24),

Title: The Innovations of Roger M. Young in Metrology and Alignment Technologies

Introduction

Roger M. Young, an accomplished inventor based in Warwick, NY, has made significant contributions to the fields of metrology management and alignment systems. With a remarkable portfolio of 14 patents, he has consistently demonstrated his dedication to advancing technology through innovative solutions.

Latest Patents

Among Roger's latest patents is a groundbreaking method for managing a metrology system. This invention involves receiving a part, identifying its type with a processing device, and retrieving relevant test rule logic and measurement data from a database. The innovation processes the measurement data, applies test rule logic, and determines whether the part should be measured. If a decision is made that the part should not be measured, it outputs the part, increments a counter, and saves the counter's value in the database.

Another notable invention is an alignment correction system, specifically designed for correcting the alignment of wafers on a chuck of a tool. This system incorporates at least one contact located near the tool's circumference and a grounded contact situated close to the contact, enhancing precision in alignment tasks.

Career Highlights

Roger M. Young is associated with the esteemed International Business Machines Corporation (IBM), where he has contributed his expertise in developing innovative technologies. His work at IBM showcases his ability to merge theoretical knowledge with practical applications in high-tech fields.

Collaborations

Throughout his career, Roger has collaborated with talented coworkers, notably Clemente Bottini and Lin Zhou. This teamwork has been instrumental in driving innovative projects and advancing their collective goals within the industry.

Conclusion

Roger M. Young's work exemplifies the spirit of innovation and the importance of advancing technology in metrology and alignment systems. As his portfolio continues to grow, his inventions remain a testament to his creativity and expertise, marking him as a prominent figure in the world of patents and inventions.

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