The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 14, 2010
Filed:
Sep. 27, 2007
Andrew C. Brendler, LaGrangeville, NY (US);
Danielle R. Chianese, Poughkeepsie, NY (US);
Susan M. Jankovsky, Beacon, NY (US);
Roger M. Young, Warwick, NY (US);
Andrew C. Brendler, LaGrangeville, NY (US);
Danielle R. Chianese, Poughkeepsie, NY (US);
Susan M. Jankovsky, Beacon, NY (US);
Roger M. Young, Warwick, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Dynamic offset determination for each of a plurality of measurement systems for matching the systems is disclosed. One embodiment uses an artifact which is periodically run across the measurement system to be matched. Inputs for each run include the current offsets and historical data for the entire fleet and the new test measurement for the current measurement system under test. Evaluation based on exponentially weighted moving average and median calculation techniques may result in a new, reset offset for one or more measurement systems. The reset offset(s) is then applied to product measurements to nullify any tool matching issues.