Andrew C Brendler

Title: Innovations by Andrew C. Brendler

Introduction

Andrew C. Brendler is an accomplished inventor based in Lagrangeville, NY (US). He has made significant contributions to the field of measurement tools, holding a total of three patents. His work focuses on enhancing the precision and efficiency of measurement systems.

Latest Patents

One of his latest patents is titled "Measurement tool monitoring using fleet measurement precision and tool matching precision analysis." This method involves monitoring a fleet of measurement tools by collecting data over a specified time interval. The process includes performing fleet measurement precision (FMP) and tool matching precision (TMP) analysis to determine the performance of each tool. If any tool is identified as poorly performing, it is flagged for improvement.

Another notable patent is the "Offset determination method for measurement system matching." This invention provides a dynamic offset determination for various measurement systems. It utilizes an artifact that is periodically run across the measurement system to be matched. The evaluation process incorporates historical data and new test measurements to establish a reset offset, which helps nullify tool matching issues.

Career Highlights

Andrew C. Brendler is currently employed at International Business Machines Corporation (IBM), where he continues to innovate in the field of measurement technology. His expertise and inventions have contributed to advancements in precision measurement systems.

Collaborations

He collaborates with talented coworkers, including Danielle R. Chianese and Susan M. Jankovsky, who share his commitment to innovation and excellence in their respective fields.

Conclusion

Andrew C. Brendler's contributions to measurement technology through his patents and work at IBM highlight his role as a significant inventor in the industry. His innovative approaches continue to enhance the precision and efficiency of measurement systems.