The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 22, 2009
Filed:
Jul. 17, 2007
Robert J. Foster, Brooklyn, NY (US);
Lin Zhou, LaGrangeville, NY (US);
Shahin Zangooie, Hopewell Junction, NY (US);
Roger M. Young, Warwick, NY (US);
Clemente Bottini, Marlboro, NY (US);
Robert J. Foster, Brooklyn, NY (US);
Lin Zhou, LaGrangeville, NY (US);
Shahin Zangooie, Hopewell Junction, NY (US);
Roger M. Young, Warwick, NY (US);
Clemente Bottini, Marlboro, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A system and method for correcting alignment of a product on a tool and, more particularly, to a system and method for correcting alignment of a wafer on a chuck of a tool. The system is a tool comprising at least one contact near a circumference of the tool and a grounded contact proximate to the at least one contact. The method comprises measuring current on each branch of a circuit and calculating an angle of a wafer based on a difference in the current on each branch of the circuit.