Growing community of inventors

Warwick, NY, United States of America

Roger M Young

Average Co-Inventor Count = 4.32

ph-index = 3

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 29

Roger M YoungLin Zhou (9 patents)Roger M YoungClemente Bottini (9 patents)Roger M YoungShahin Zangooie (8 patents)Roger M YoungRonald D Fiege (5 patents)Roger M YoungRobert J Foster (5 patents)Roger M YoungAndrew C Brendler (2 patents)Roger M YoungSusan M Jankovsky (2 patents)Roger M YoungTimothy L Holmes (2 patents)Roger M YoungDanielle R Chianese (2 patents)Roger M YoungDarryl D Restaino (1 patent)Roger M YoungEric Peter Solecky (1 patent)Roger M YoungJeffrey P Gifford (1 patent)Roger M YoungJonathan Levy (1 patent)Roger M YoungChristopher E Pepe (1 patent)Roger M YoungSusan M Cianfrani (1 patent)Roger M YoungWilliam K Hoffman, Jr (1 patent)Roger M YoungShahin Zangodie (1 patent)Roger M YoungRoger M Young (14 patents)Lin ZhouLin Zhou (37 patents)Clemente BottiniClemente Bottini (9 patents)Shahin ZangooieShahin Zangooie (12 patents)Ronald D FiegeRonald D Fiege (6 patents)Robert J FosterRobert J Foster (5 patents)Andrew C BrendlerAndrew C Brendler (3 patents)Susan M JankovskySusan M Jankovsky (2 patents)Timothy L HolmesTimothy L Holmes (2 patents)Danielle R ChianeseDanielle R Chianese (2 patents)Darryl D RestainoDarryl D Restaino (36 patents)Eric Peter SoleckyEric Peter Solecky (30 patents)Jeffrey P GiffordJeffrey P Gifford (7 patents)Jonathan LevyJonathan Levy (3 patents)Christopher E PepeChristopher E Pepe (2 patents)Susan M CianfraniSusan M Cianfrani (2 patents)William K Hoffman, JrWilliam K Hoffman, Jr (1 patent)Shahin ZangodieShahin Zangodie (1 patent)
..
Inventor’s number of patents
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Strength of working relationships

Company Filing History:

1. International Business Machines Corporation (14 from 164,108 patents)


14 patents:

1. 9652729 - Metrology management

2. 8736275 - Alignment correction system and method of use

3. 8680871 - Alignment correction system and method of use

4. 8451008 - Alignment correction system and method of use

5. 8411270 - Monitoring stage alignment and related stage and calibration target

6. 7937177 - Manufacturing work in process management system

7. 7853345 - Offset determination method for measurement system matching

8. 7742160 - Determining angle of incidence with respect to workpiece

9. 7646491 - Determining azimuth angle of incident beam to wafer

10. 7592817 - Alignment correction system and method of use

11. 7542136 - Flipping stage arrangement for reduced wafer contamination cross section and improved measurement accuracy and throughput

12. 7477365 - Optical spot geometric parameter determination using calibration targets

13. 7318206 - Offset determination for measurement system matching

14. 7248936 - Automated tool recipe verification and correction

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as of
12/3/2025
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