Robert J Rathert

Title: The Innovative Contributions of Robert J Rathert

Introduction

Robert J Rathert is a notable inventor based in Mechanicsville, VA (US), recognized for his significant contributions to the field of semiconductor technology. With a total of 11 patents to his name, Rathert has made substantial advancements in die screening systems and diagnostics.

Latest Patents

Rathert's latest patents include groundbreaking technologies such as "Imaging reflectometry for inline screening." This invention involves a die screening system that utilizes die-resolved metrology data from in-line metrology tools after fabrication steps. The system generates screening data for a population of dies, categorizing them into various disposition classes based on variability in the screening data. Another notable patent is the "System for automatic diagnostics and monitoring of semiconductor defect die screening performance through overlay of defect and electrical test data." This system identifies defect results and electrical test results, generating correlation metrics to diagnose the performance of the screening system.

Career Highlights

Throughout his career, Rathert has worked with prominent companies in the semiconductor industry, including KLA Corporation and KLA-Tencor Corporation. His work has been instrumental in enhancing the efficiency and accuracy of semiconductor manufacturing processes.

Collaborations

Rathert has collaborated with esteemed colleagues such as David W Price and Oreste Donzella, contributing to the advancement of semiconductor technologies through teamwork and shared expertise.

Conclusion

Robert J Rathert's innovative patents and career achievements highlight his significant impact on the semiconductor industry. His work continues to influence the development of advanced screening systems and diagnostics, showcasing the importance of innovation in technology.