Growing community of inventors

Mechanicsville, VA, United States of America

Robert J Rathert

Average Co-Inventor Count = 4.84

ph-index = 2

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 15

Robert J RathertDavid W Price (11 patents)Robert J RathertOreste Donzella (9 patents)Robert J RathertChet V Lenox (8 patents)Robert J RathertJohn Charles Robinson (6 patents)Robert J RathertKara L Sherman (4 patents)Robert J RathertRobert Cappel (3 patents)Robert J RathertBarry Saville (2 patents)Robert J RathertMike Von Den Hoff (2 patents)Robert J RathertJustin Lach (2 patents)Robert J RathertThomas Groos (2 patents)Robert J RathertShifang Li (1 patent)Robert J RathertStilian Pandev (1 patent)Robert J RathertNaema Bhatti (1 patent)Robert J RathertTeng-Song Lim (1 patent)Robert J RathertDoug Sutherland (1 patent)Robert J RathertDouglas G Sutherland (1 patent)Robert J RathertRobert J Rathert (11 patents)David W PriceDavid W Price (13 patents)Oreste DonzellaOreste Donzella (11 patents)Chet V LenoxChet V Lenox (8 patents)John Charles RobinsonJohn Charles Robinson (23 patents)Kara L ShermanKara L Sherman (4 patents)Robert CappelRobert Cappel (3 patents)Barry SavilleBarry Saville (4 patents)Mike Von Den HoffMike Von Den Hoff (4 patents)Justin LachJustin Lach (2 patents)Thomas GroosThomas Groos (2 patents)Shifang LiShifang Li (71 patents)Stilian PandevStilian Pandev (63 patents)Naema BhattiNaema Bhatti (1 patent)Teng-Song LimTeng-Song Lim (1 patent)Doug SutherlandDoug Sutherland (1 patent)Douglas G SutherlandDouglas G Sutherland (1 patent)
..
Inventor’s number of patents
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Strength of working relationships

Company Filing History:

1. Kla Corporation (10 from 528 patents)

2. Kla Tencor Corporation (1 from 1,787 patents)


11 patents:

1. 12422376 - Imaging reflectometry for inline screening

2. 12332182 - System for automatic diagnostics and monitoring of semiconductor defect die screening performance through overlay of defect and electrical test data

3. 11899065 - System and method to weight defects with co-located modeled faults

4. 11798827 - Systems and methods for semiconductor adaptive testing using inline defect part average testing

5. 11754625 - System and method for identifying latent reliability defects in semiconductor devices

6. 11656274 - Systems and methods for evaluating the reliability of semiconductor die packages

7. 11624775 - Systems and methods for semiconductor defect-guided burn-in and system level tests

8. 11614480 - System and method for Z-PAT defect-guided statistical outlier detection of semiconductor reliability failures

9. 11293970 - Advanced in-line part average testing

10. 10867877 - Targeted recall of semiconductor devices based on manufacturing data

11. 10761128 - Methods and systems for inline parts average testing and latent reliability defect detection

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as of
12/4/2025
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