San Jose, CA, United States of America

Patrick Huet


Average Co-Inventor Count = 5.7

ph-index = 6

Forward Citations = 180(Granted Patents)


Company Filing History:


Years Active: 2004-2016

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13 patents (USPTO):Explore Patents

Title: The Innovations of Patrick Huet

Introduction

Patrick Huet is a notable inventor based in San Jose, CA, with a significant contribution to the field of semiconductor technology. He holds a total of 13 patents, showcasing his expertise and innovative spirit in developing advanced methods for defect classification and analysis in semiconductor wafers.

Latest Patents

Among his latest patents is a groundbreaking invention titled "Decision tree construction for automatic classification of defects on semiconductor wafers." This patent outlines methods and systems for creating a decision tree that classifies defects detected on a wafer by manipulating floating trees as individual units. Another significant patent is focused on "Computer-implemented methods for performing one or more defect-related functions." This invention includes various methods for identifying noise in inspection data, binning defects based on characteristics, and selecting defects for analysis, thereby enhancing the efficiency of defect management in semiconductor manufacturing.

Career Highlights

Throughout his career, Patrick Huet has worked with prominent companies in the semiconductor industry, including Kla Tencor Corporation and Kla-Tencor Technologies Corporation. His work has significantly impacted the way defects are managed and classified in semiconductor production, leading to improved quality and efficiency.

Collaborations

Patrick has collaborated with esteemed colleagues such as Martin Plihal and Robinson Piramuthu, contributing to the advancement of technologies in their field.

Conclusion

Patrick Huet's contributions to semiconductor technology through his innovative patents and collaborations have made a lasting impact on the industry. His work continues to influence the methods used for defect classification and analysis, showcasing the importance of innovation in technology.

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