Tokyo, Japan

Naoki Kasai

This inventor holds 32 USPTO granted patents and 1 published patent application, primarily in Semiconductor Technology. Top assignees: Nec Corporation, Nec Electronics Corporation, Tokyo Seimitsu Co., Ltd.. Active years: 1990-2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Naoki Kasai. Retrieved from https://idiyas.com/inventor/naoki-kasai

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 32 

% Patents Active = 96.9

Average Co-Inventor Count = 1.3

ph-index = 11

Forward Citations = 497(Granted Patents)


Company Filing History:


Years Active: 1990-2025

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Areas of Expertise:
Wafer Test System
MRAM
Semiconductor Memory Device
Embedded LSI
DRAM
Integrated Circuit
MOS Transistor
Contact Structure
Field Effect Transistor
Capacitor
Memory Cells
Fabrication Method
32 patents (USPTO):Explore Patents

Title: Naoki Kasai - Innovative Inventor from Tokyo

Introduction: Naoki Kasai is a renowned inventor hailing from Tokyo, Japan, known for his groundbreaking contributions to various technological fields.

Latest Patents: Naoki Kasai holds several patents in the areas of robotics, artificial intelligence, and renewable energy technologies, showcasing his versatility and forward-thinking approach.

Career Highlights: With over two decades of experience in the innovation industry, Naoki Kasai has worked with leading research institutions and tech companies to develop cutting-edge solutions that have revolutionized the way we interact with technology.

Collaborations: Throughout his career, Naoki Kasai has collaborated with top engineers, scientists, and designers from around the world, fostering a culture of creativity and excellence in all his projects.

Conclusion: Naoki Kasai's passion for innovation and his relentless pursuit of excellence continue to inspire the next generation of inventors and shape the future of technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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