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For the Inventor, By the Inventor

Tokyo, Japan

Tokyo Seimitsu Co., Ltd.


USPTO Granted Patents = 323



Trademarks = 16

Forward Citations = 2,218

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266 inventors (with patents filed for the assignee):

goldMedal Takashi Fujita (24 out of 163 patents)

silverMedal Minoru Numoto (23 out of 23 patents)

bronzeMedal Takao Inaba (17 out of 17 patents)

4.  Masayuki Azuma (14 out of 16 patents)

5.  Katsuo Honda (12 out of 13 patents)

6.  Minoru Ametani (10 out of 10 patents)

7.  Kenji Sakai (10 out of 10 patents)

8.  Masaki Kanazawa (9 out of 9 patents)

9.  Shozo Katamachi (9 out of 9 patents)

10.  Hideki Morii (8 out of 8 patents)

11.  Masayuki Kuwabara (8 out of 10 patents)

12.  Toshihiko Ishikawa (8 out of 8 patents)

13.  Yasushi Katagiri (8 out of 8 patents)

14.  Ichiro Katayama (8 out of 8 patents)

15.  Takeshi Kagamida (8 out of 8 patents)


Core Competencies:
Shape Measurement Device
Wafer Processing
Temperature Control System
Prober Technology
Laser Machining
Surface Property Measurement
Three-Dimensional Measurement
Particle Measurement
Dicing Tape Detection
Calibration Methods
Automatic Balancer
Workpiece Processing

323 patents:

1. 12474164 - Alignment method, shape measuring method and shape measuring apparatus (2025-11-18),
2. 12466687 - Tape affixing system (2025-11-11),
3. 12463068 - Sheet release apparatus (2025-11-04),
4. 12456217 - Shape measurement device (2025-10-28),
5. 12449474 - Drive control device, drive control method, program and prober (2025-10-21),
6. 12447507 - Wafer back surface cleaning device (2025-10-21),
7. 12444626 - Temperature control device for semiconductor wafer and temperature control method for semiconductor wafer (2025-10-14),
8. 12399215 - Housing and prober (2025-08-26),
9. 12387966 - Wafer chuck, temperature control system, and temperature control method (2025-08-12),
10. 12379272 - Apparatus and method for detecting tension abnormality in dicing tape (2025-08-05),
11. 12373974 - Shape measurement device and method for controlling same (2025-07-29),
12. 12368064 - Tape affixing apparatus (2025-07-22),
13. 12298121 - Calibration method for optical rotation probe (2025-05-13),
14. 12282061 - Wafer test system, probe card replacing method, and prober (2025-04-21),
15. 12281956 - Automatic balancer (2025-04-21),
Tokyo Seimitsu Co., Ltd. is a Japanese company specializing in the manufacture of precision measurement and inspection equipment. Established in 1949, the company has grown to become a global leader in the industry. Tokyo Seimitsu's products are widely used in various fields such as semiconductors, electronics, automotive, and medical. The company's commitment to innovation, quality, and customer satisfaction has earned them a strong reputation in the market.
This text is generated by artificial intelligence and may not be accurate.

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USPTO Data Jan 1 1976 - Dec 30 2025

323 Patents

#231 in Tokyo

#497 in Japan

#2,700 in the World

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Tokyo, Japan

Tokyo Seimitsu Co., Ltd.

Forward Citations = 2,218

266 inventors:

goldMedal Takashi Fujita (24 out of 163 patents)

silverMedal Minoru Numoto (23 out of 23 patents)

bronzeMedal Takao Inaba (17 out of 17 patents)

4.  Masayuki Azuma (14 out of 16 patents)

5.  Katsuo Honda (12 out of 13 patents)

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