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For the Inventor, By the Inventor

Hamilton, MA, United States of America

Mehran Nasser-Ghodsi

This inventor holds 44 USPTO granted patents and 2 published patent applications and 4 EPO patents, primarily in Electron Beam Inspection. Top assignees: Kla Tencor Corporation, Kla-Tencor Technologies Corporation, Ebara Corporation. Active years: 1999-2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Mehran Nasser-Ghodsi. Retrieved from https://idiyas.com/inventor/mehran-nasser-ghodsi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 44 

% Patents Active = 52.3

 

Average Co-Inventor Count = 2.8

ph-index = 10

Forward Citations = 315(Granted Patents)


Location History:

  • Halmilton, MA (US) (2009)
  • Hamilton, CA (US) (2012)
  • Hamilton, MA (US) (1999 - 2019)

Company Filing History:

goldMedal21 out of 1,787 
 
Kla Tencor Corporation
 patents
silverMedal19 out of 641 
 
Kla-Tencor Technologies Corporation
 patents
bronzeMedal3 out of 2,576 
 
Ebara Corporation
 patents
4. 1 out of 2 
 
Kla-Technologies Corporation
 patents

Years Active: 1999-2019

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Areas of Expertise:
Electron Beam Inspection
Scanning Electron Microscopy
Auger Elemental Identification
Multi-layer Ceramic
Contamination Sensitive Emitters
Defect Characterization
Substrate Analysis
Electron Emitter Device
Magnetic Field Mapping
Electrical Conduction Path
Calibration Standard
Electron Generation System
44 patents (USPTO):Explore Patents
1. 10354832 - Multi-column scanning electron microscopy system (2019-07-16),
2. 9793089 - Electron emitter device with integrated multi-pole electrode structure (2017-10-17),
3. 9679372 - Apparatus and methods for inspecting extreme ultra violet reticles (2017-06-13),
4. 9591770 - Multi-layer ceramic vacuum to atmosphere electric feed through (2017-03-07),
5. 9513230 - Apparatus and method for optical inspection, magnetic field and height mapping (2016-12-06),
6. 9418819 - Asymmetrical detector design and methodology (2016-08-16),
7. 8953869 - Apparatus and methods for inspecting extreme ultra violet reticles (2015-02-10),
8. 8890066 - Sharp scattering angle trap for electron beam apparatus (2014-11-18),
9. 8765496 - Methods and systems for measuring a characteristic of a substrate or preparing a substrate for analysis (2014-07-01),
10. 8698094 - Permanent magnet lens array (2014-04-15),
11. 8658973 - Auger elemental identification algorithm (2014-02-25),
12. 8633457 - Background reduction system including louver (2014-01-21),
13. 8618513 - Apparatus and methods for forming an electrical conduction path through an insulating layer (2013-12-31),
14. 8530867 - Electron generation and delivery system for contamination sensitive emitters (2013-09-10),
15. 8513619 - Non-planar extractor structure for electron source (2013-08-20),

Title: Innovations of Mehran Nasser-Ghodsi in Advanced Electron Microscopy

Introduction

Mehran Nasser-Ghodsi, based in Hamilton, MA, is a prolific inventor with a remarkable portfolio of 44 patents. His work primarily focuses on advancements in electron microscopy and field emission technologies, contributing significantly to the field of materials science and imaging analysis.

Latest Patents

Among his latest patents is a multi-column scanning electron microscopy system. This innovative SEM system features a source assembly that includes multiple electron beam sources and actuated positioners to generate a range of electron beams. The system incorporates a column assembly with substrate arrays and optical columns tailored for detailed imaging. Another notable patent is an electron emitter device with an integrated multi-pole electrode structure. This field emission device consists of high aspect ratio emitter elements and segmented electrodes with multiple plates designed to enhance emission efficiency.

Career Highlights

Throughout his career, Mehran Nasser-Ghodsi has made significant strides in the field of electron microscopy. His contributions during his tenure at Kla Tencor Corporation and Kla-Tencor Technologies Corporation have laid the groundwork for innovations that are now pivotal in the analysis of materials at the nanoscale.

Collaborations

Mehran has collaborated with several notable professionals, including Robert Haynes and Rudy Flores Garcia. These collaborations have facilitated the exchange of ideas and advancements in technology, further enhancing the impact of his work in the scientific community.

Conclusion

Mehran Nasser-Ghodsi continues to innovate within the realm of electron microscopy and field emission devices, enriching the scientific landscape with his patents. His contributions will undoubtedly influence future research and applications in various industries, underscoring the importance of his work as an inventor.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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