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For the Inventor, By the Inventor

Austin, TX, United States of America

Matthew S Ryskoski

This inventor holds 14 USPTO granted patents. Top assignees: Advanced Micro Devices Corporation, Globalfoundries Inc.. Active years: 2002-2011.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Matthew S Ryskoski. Retrieved from https://idiyas.com/inventor/matthew-s-ryskoski

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 14

% Patents Active = 42.9

Average Co-Inventor Count = 1.4

ph-index = 5

Forward Citations = 87(Granted Patents)


Location History:

  • Kyle, TX (US) (2002 - 2010)
  • Austin, TX (US) (2011)

Company Filing History:

goldMedal12 out of 13,168 
 
Advanced Micro Devices Corporation
 patents
silverMedal2 out of 5,671 
 
Globalfoundries Inc.
 patents

Years Active: 2002-2011

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14 patents (USPTO):Explore Patents
1. 8040140 - Method and apparatus for identifying broken pins in a test socket (2011-10-18),
2. 7695986 - Method and apparatus for modifying process selectivities based on process state information (2010-04-13),
3. 7282374 - Method and apparatus for comparing device and non-device structures (2007-10-16),
4. 7277824 - Method and apparatus for classifying faults based on wafer state data and sensor tool trace data (2007-10-02),
5. 7217578 - Advanced process control of thermal oxidation processes, and systems for accomplishing same (2007-05-15),
6. 7197370 - Method and apparatus for dynamic adjustment of an active sensor list (2007-03-27),
7. 6978187 - Method and apparatus for scheduling production lots based on lot and tool health metrics (2005-12-20),
8. 6868353 - Method and apparatus for determining wafer quality profiles (2005-03-15),
9. 6799311 - Batch/lot organization based on quality characteristics (2004-09-28),
10. 6721616 - Method and apparatus for determining control actions based on tool health and metrology data (2004-04-13),
11. 6617258 - Method of forming a gate insulation layer for a semiconductor device by controlling the duration of an etch process, and system for accomplishing same (2003-09-09),
12. 6593227 - Method and apparatus for planarizing surfaces of semiconductor device conductive layers (2003-07-15),
13. 6582975 - Method of controlling the deposition of inter-level dielectric layers based upon electrical performance tests, and system for accomplishing same (2003-06-24),
14. 6371135 - Method and apparatus for removing a particle from a surface of a semiconductor wafer (2002-04-16),

Title: The Innovations of Matthew S Ryskoski

Introduction

Matthew S Ryskoski is a notable inventor based in Austin, TX (US). He has made significant contributions to the field of technology, holding a total of 14 patents. His work primarily focuses on methods and apparatuses that enhance testing processes in semiconductor manufacturing.

Latest Patents

Among his latest patents is a method and apparatus for identifying broken pins in a test socket. This innovative method includes scanning a test socket after the removal of a device under test to generate scan data. The scan data is then compared to reference data to identify the presence of at least a portion of a pin in the test socket. Additionally, he has developed a method and apparatus for modifying process selectivities based on process state information. This invention involves accessing process state information associated with material removal processes, determining selectivity based on this information, and modifying process parameters accordingly.

Career Highlights

Matthew has worked with prominent companies in the semiconductor industry, including Advanced Micro Devices Corporation and Globalfoundries Inc. His experience in these organizations has allowed him to refine his skills and contribute to various innovative projects.

Collaborations

Throughout his career, Matthew has collaborated with talented individuals such as Kevin R Lensing and Michael J McBride. These partnerships have fostered a creative environment that has led to the development of groundbreaking technologies.

Conclusion

Matthew S Ryskoski's contributions to the field of technology through his patents and collaborations highlight his innovative spirit and dedication to advancing semiconductor testing processes. His work continues to influence the industry and inspire future inventors.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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