The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 18, 2011
Filed:
Nov. 15, 2010
Matthew S. Ryskoski, Austin, TX (US);
Christopher L. Wooten, Austin, TX (US);
Song Han, Austin, TX (US);
Douglas C. Kimbrough, Austin, TX (US);
Matthew S. Ryskoski, Austin, TX (US);
Christopher L. Wooten, Austin, TX (US);
Song Han, Austin, TX (US);
Douglas C. Kimbrough, Austin, TX (US);
GLOBALFOUNDRIES, Inc., Grand Cayman, KY;
Abstract
A method includes scanning a test socket after removal of a device under test to generate scan data. The scan data is compared to reference data. A presence of at least a portion of a pin in the test socket is identified based on the comparison. A test system includes a test socket, a scanner, and a control unit. The test socket is operable to receive devices under test. The scanner is operable to scan a test socket after removal of a device under test to generate scan data. The control unit is operable to compare the scan data to reference data and identify a presence of at least a portion of a pin in the test socket based on the comparison.