Christopher L Wooten

Title: Christopher L. Wooten: Innovator in Test Socket Technology

Introduction

Christopher L. Wooten, an inventive mind based in Austin, TX, has significantly contributed to the field of test socket technologies. With three patents to his name, Wooten's innovations focus on improving measurement processes and defect identification in semiconductor testing.

Latest Patents

Wooten's latest patents showcase his prowess in creating effective solutions for the semiconductor industry. One of his notable inventions is the "Method and apparatus for identifying broken pins in a test socket." This invention involves scanning a test socket after the removal of a device under test to generate scan data, which is then compared to reference data to identify the presence of any broken pins.

Another relevant patent is the "Method and apparatus for measuring cumulative defects." This invention outlines a methodology to determine a cumulative defect measure for a wafer lot by inspecting various process layers for defects and quantifying the overall defectiveness of the selected lot.

Career Highlights

Christopher L. Wooten has built a notable career, having worked with prestigious companies such as Advanced Micro Devices Corporation and Globalfoundries Inc. His experience in these organizations has contributed to his profound understanding of semiconductor technologies and their testing requirements.

Collaborations

Throughout his career, Wooten has collaborated with esteemed colleagues, including Craig William Christian and Thomas E. Spikes, Jr. Their collective efforts have driven innovation and facilitated advancements in the field of semiconductor testing.

Conclusion

Christopher L. Wooten's contributions to patent technology highlight his expertise and commitment to pioneering improvements in the semiconductor industry. His inventions not only underscore his innovative spirit but also enhance the efficacy of testing processes, benefiting manufacturers and engineers alike.