The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 28, 2004
Filed:
Jun. 27, 2002
Applicant:
Inventor:
Matthew Ryskoski, Kyle, TX (US);
Assignee:
Advanced Micro Devices, Inc., Austin, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/750 ; G01R 3/126 ;
U.S. Cl.
CPC ...
G06F 1/750 ; G01R 3/126 ;
Abstract
A method and an apparatus for performing a batch organization of semiconductor wafers. Data relating to metrology data associated with a processed semiconductor wafer in a lot is acquired. A quality characteristic associated with the processed semiconductor wafer is determined based upon the metrology data. A plurality of semiconductor wafers associated with the lot re-organized for subsequent processing, based upon the quality characteristic.