Company Filing History:

19 out of 10,295

Tokyo Electron Limited

patents

1 out of 71

Tokyo Electron Yamanashi Limited

patents

1 out of 101

Tokyo Electron Limi Ted

patents

where one patent can have more than one assignee

Years Active: 1995-2014

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20 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 8726748 - Probe apparatus and substrate transfer method (2014-05-20),

2. 8294480 - Inspection apparatus having alignment mechanism (2012-10-23),

3. 8113084 - Mounting device (2012-02-14),

4. 8027528 - Method for calculating height of chuck top and program storage medium for storing same method (2011-09-27),

5. 7963513 - Mounting device (2011-06-21),

6. 7940065 - Probe apparatus and method for measuring electrical characteristics of chips (2011-05-10),

7. 7859283 - Probe apparatus, probing method, and storage medium (2010-12-28),

8. 7839156 - Method for detecting tip position of probe, alignment method, apparatus for detecting tip position of probe and probe apparatus (2010-11-23),

9. 7772862 - Alignment method, tip position detecting device and probe apparatus (2010-08-10),

10. 7719297 - Probe apparatus and method for measuring electrical characteristics of chips and storage medium therefor (2010-05-18),

11. 7701236 - Each inspection units of a probe apparatus is provided with an imaging unit to take an image of a wafer (2010-04-20),

12. 7556246 - Unloading method of object, program storage medium, and mounting mechanism (2009-07-07),

13. 7385386 - Transporting mechanism, movable probe card transporting apparatus using transporting mechanism, and prober (2008-06-10),

14. 6958618 - Transporting mechanism, movable probe card transporting apparatus using transporting mechanism, and prober (2005-10-25),

15. 6838892 - Probe card carrier and method of carrying probe card (2005-01-04),

Title: Masaru Suzuki: Innovator in Probe and Inspection Technologies

Introduction

Masaru Suzuki, an accomplished inventor from Nirasaki, Japan, has made significant contributions to the fields of probe apparatus and inspection technologies. With 20 patents to his name, his innovative spirit has propelled advancements in how substrates are processed and inspected in various applications.

Latest Patents

Suzuki's latest inventions showcase his expertise in developing sophisticated apparatuses. One notable patent is the "Probe Apparatus and Substrate Transfer Method," which features a design that includes multiple prober chambers arranged in a straight line. This apparatus utilizes a substrate transfer mechanism to effectively move test target substrates between chambers, enhancing efficiency in substrate handling and testing processes. Additionally, he has developed an "Inspection Apparatus Having Alignment Mechanism," which includes a mounting table that can move in both X and Y directions. This apparatus is designed to perform precise alignments of target objects, facilitated by a movable image pickup device and an intelligent control system for preliminary alignments.

Career Highlights

Throughout his career, Masaru Suzuki has been associated with prominent companies, including Tokyo Electron Limited and Tokyo Electron Yamanashi Limited. His work has contributed to pioneering advancements in technology related to semiconductor manufacturing and inspection, solidifying his reputation as a leader in his field.

Collaborations

Suzuki has collaborated with brilliant minds such as Kazuya Yano and Yasuhito Yamamoto, leveraging their combined expertise to achieve remarkable advancements in their research and development projects. Their partnership has been instrumental in pushing the boundaries of technological innovation in the industry.

Conclusion

Masaru Suzuki's impressive portfolio of patents and his contributions to the field of substrate processing and inspection underscore his role as an innovator. His relentless pursuit of excellence in technology continues to inspire future generations of inventors and engineers, ensuring that his legacy will endure in the realm of innovations.

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