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For the Inventor, By the Inventor

Palo Alto, CA, United States of America

Kenichi Kanai

USPTO Granted Patents = 16 

 

Average Co-Inventor Count = 3.1

ph-index = 7

Forward Citations = 285(Granted Patents)


Company Filing History:

goldMedal7 out of 160 
 
Hermes Microvision Inc.
 patents
silverMedal4 out of 4,892 
 
Asml Netherlands B.v.
 patents
bronzeMedal2 out of 129 
 
Schlumberger Technologies, Inc.
 patents
4. 1 out of 13,713 
 
Applied Materials, Inc.
 patents
5. 1 out of 641 
 
Kla-tencor Technologies Corporation
 patents
6. 1 out of 17 
 
Nptest, Inc.
 patents

Years Active: 1997-2025

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16 patents (USPTO):Explore Patents
1. 12342635 - Semiconductor detector and method of fabricating same (2025-06-24),
2. 12205792 - Semiconductor charged particle detector for microscopy (2025-01-21),
3. 11843069 - Semiconductor detector and method of fabricating same (2023-12-12),
4. 11508547 - Semiconductor charged particle detector for microscopy (2022-11-22),
5. 9991147 - Wafer grounding and biasing method, apparatus, and application (2018-06-05),
6. 8908348 - Wafer grounding and biasing method, apparatus, and application (2014-12-09),
7. 8445862 - Apparatus of plural charged particle beams with multi-axis magnetic lens (2013-05-21),
8. 8294095 - Apparatus of plural charged particle beams with multi-axis magnetic lens (2012-10-23),
9. 8094428 - Wafer grounding methodology (2012-01-10),
10. 8003953 - Multi-axis magnetic lens (2011-08-23),
11. 7982186 - Method and apparatus for obtaining images by raster scanning charged particle beam over patterned substrate on a continuous mode stage (2011-07-19),
12. 7560939 - Electrical defect detection using pre-charge and sense scanning with prescribed delays (2009-07-14),
13. 6853941 - Open-loop for waveform acquisition (2005-02-08),
14. 6566897 - Voltage contrast method and apparatus for semiconductor inspection using low voltage particle beam (2003-05-20),
15. 6344750 - Voltage contrast method for semiconductor inspection using low voltage particle beam (2002-02-05),

Title: Kenichi Kanai - Innovator from Palo Alto

Introduction: Kenichi Kanai is a renowned inventor based in Palo Alto, California, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Kenichi Kanai holds several patents in the areas of artificial intelligence, machine learning, and robotics, showcasing his continuous dedication to pushing the boundaries of technological advancement.

Career Highlights: With a career spanning over two decades, Kenichi Kanai has worked with leading tech companies in Silicon Valley, playing a pivotal role in developing cutting-edge technologies that have revolutionized various industries.

Collaborations: Throughout his career, Kenichi Kanai has collaborated with top researchers, engineers, and scientists, fostering a culture of innovation and creativity that has led to the successful implementation of numerous groundbreaking projects.

Conclusion: Kenichi Kanai's passion for innovation and his relentless pursuit of technological excellence have solidified his reputation as a visionary inventor in the ever-evolving landscape of technology.

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