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San Jose, CA, United States of America

Schlumberger Technologies, Inc.

Calculating rank

USPTO Granted Patents = 129

% Expired Patents = 0.78

EPO Patents = 1

Forward Citations = 3,722

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151 inventors (with patents filed for the assignee):

Christopher G Talbot (13 out of 22 patents)

Burnell G West (10 out of 37 patents)

Egbert Graeve (8 out of 9 patents)

4. Chiwoei Wayne Lo (6 out of 14 patents)

5. Michael Frank Deering (5 out of 141 patents)

6. Douglas K Masnaghetti (5 out of 21 patents)

7. Edwin A Sloane (5 out of 20 patents)

8. Kenneth R Wilsher (5 out of 18 patents)

9. H Keith Nishihara (4 out of 38 patents)

10. Stephen Whittacker Into (4 out of 6 patents)

11. James Henry Brown (4 out of 4 patents)

12. Neil W Richardson (4 out of 23 patents)

13. William K Lo (4 out of 11 patents)

14. Paul J Duval (3 out of 15 patents)

15. Neal T Sullivan (3 out of 14 patents)

Core Competencies:

Integrated Circuits

Defect Detection

Charged Particle Beam

Noise Reduction

Wien Filter

Digital Image Signal

Optical Probing

FIB Operations

Temperature Control

Semiconductor Inspection

Waveform Acquisition

Test Equipment

129 patents: Sort by Forward Citations

1. 9772425 - Distinguishing mud filtrate from formation water by multi-DOI NMR (2017-09-26),

2. 9284782 - Eccentric steering device and methods of directional drilling (2016-03-15),

3. 7093177 - Low-jitter clock for test system (2006-08-15),

4. 6717143 - Beam alignment in a lower column of a scanning electron microscope or the like (2004-04-06),

5. 6717141 - Reduction of aberrations produced by Wien filter in a scanning electron microscope and the like (2004-04-06),

6. 6678932 - Fixture for assembling parts of a device such as a Wien filter (2004-01-20),

7. 6671845 - Packet-based device test system (2003-12-30),

8. 6624426 - Split magnetic lens for controlling a charged particle beam (2003-09-23),

9. 6612159 - Overlay registration error measurement made simultaneously for more than two semiconductor wafer layers (2003-09-02),

10. 6593578 - Wien filter for use in a scanning electron microscope or the like (2003-07-15),

11. 6553522 - Valuation of tester accuracy (2003-04-22),

12. 6532310 - Removing noise caused by artifacts from a digital image signal (2003-03-11),

13. 6528798 - Technique for manufacturing an electrostatic element for steering a charged particle beam (2003-03-04),

14. 6518571 - Through-the-substrate investigation of flip-chip IC's (2003-02-11),

15. 6501288 - On-chip optically triggered latch for IC time measurements (2002-12-31),

Company Overview

Schlumberger Technologies, Inc., based in San Jose, California, specializes in integrated circuit testing solutions. The company focuses on advanced technologies for defect detection and noise reduction in semiconductor manufacturing. Its expertise encompasses charged particle beam applications, Wien filter technology, and digital image signal processing, alongside optical probing and focused ion beam (FIB) operations. Schlumberger is committed to enhancing the reliability and performance of integrated circuits through innovative testing methodologies.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Nov 3 2026

129 Patents

#96 in San Jose, CA

#679 in California

#3,014 in US

#6,231 in the World

San Jose, CA, United States of America

Schlumberger Technologies, Inc.

Forward Citations = 3,722

151 inventors:

Christopher G Talbot (13 out of 22 patents)

Burnell G West (10 out of 37 patents)

Egbert Graeve (8 out of 9 patents)

4. Chiwoei Wayne Lo (6 out of 14 patents)

5. Michael Frank Deering (5 out of 141 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Schlumberger Technologies, Inc.. Retrieved from https://idiyas.com/company/schlumberger-technologies

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

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