Burnell G West

Title: Innovations by Burnell G. West in Integrated Circuit Testing

Introduction

Burnell G. West is a prominent inventor based in Half Moon Bay, California, holding an impressive portfolio of 37 patents. His work has significantly contributed to the fields of integrated circuit devices and semiconductor diagnostics, showcasing innovative designs and methodologies that enhance testing efficiencies.

Latest Patents

One of West's notable patents revolves around "Test systems and methods for integrated circuit devices." This invention encompasses a test system featuring a timing generation circuit and formatter integrated on a single CMOS (complementary metal oxide semiconductor) circuit. The timing generation circuit produces software words, which the formatter uses to manage transitions and precision in edge placement. Noteworthy is the formatter's structure, consisting of a drive and response circuit, each comprising slices that can handle independent data streams for enhanced formatting and strobing.

Another critical patent of West's involves "Test and diagnosis of semiconductors," a method aimed at automating the diagnostic process in testing environments. This approach includes identifying a fail condition within a device under test (DUT), followed by the selection of an appropriate diagnostic suite for troubleshooting. If a needed suite is not already accessible, the system generates one, improving testing reliability and efficiency.

Career Highlights

Throughout his career, Burnell G. West has been affiliated with notable companies such as Credence Systems Corporation and Schlumberger Technologies, Inc. His roles in these organizations allowed him to directly impact semiconductor testing technologies, driving innovation in the industry.

Collaborations

In his professional journey, West has collaborated with prominent peers like Madhukar B. Vora and Egbert Graeve. These partnerships have fostered a creative exchange of ideas, contributing to the development of cutting-edge solutions in the realm of electronics and testing methodologies.

Conclusion

Burnell G. West's contributions to the field of integrated circuit testing and semiconductor diagnostics are marked by his substantive patents and collaborations. His innovative methods and systems not only enhance device testing but also advance the technology, setting new standards in the industry. As he continues to build upon his extensive patent portfolio, West remains an influential figure in the realm of engineering and technology.