The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 18, 2008
Filed:
Aug. 23, 2005
Jamie S. Cullen, San Jose, CA (US);
Burnell G. West, Half Moon Bay, CA (US);
Jamie S. Cullen, San Jose, CA (US);
Burnell G. West, Half Moon Bay, CA (US);
Credence Systems Corporation, Milpitas, CA (US);
Abstract
A system and method for processing scan data for integrated circuit testing. Scan data is divided into three groups of scan data segments: scan-in data segments, scan-out data segments and scan-mask data segments. The sequence of scan data segments in each group constitutes the operative test data in a scan stream. Each scan stream is represented by a table having a row corresponding to each scan data segment in the stream. Each row has four fields: a start address, a segment length, a start pad length and an end pad length. Scan streams consist of the bit sequence of segment data interposed by dummy data corresponding in length to the start pad and end pad lengths. Scan streams are interleaved by using the pad lengths to time the processing of scan data segments.