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Milpitas, CA, United States of America

Credence Systems Corporation

USPTO Granted Patents = 253

% Expired Patents = 29.2

Forward Citations = 3,465

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215 inventors (with patents filed for the assignee):

Paul Dana Wohlfarth (15 out of 17 patents)

Burnell G West (14 out of 37 patents)

Steven Kasapi (13 out of 24 patents)

4. Brian J Arkin (12 out of 14 patents)

5. Charles A Miller (11 out of 119 patents)

6. Bryan J Dinteman (11 out of 12 patents)

7. Gary J Lesmeister (11 out of 11 patents)

8. Theodore R Lundquist (9 out of 24 patents)

9. Jeffrey D Currin (9 out of 9 patents)

10. Lawrence A Kraus (9 out of 9 patents)

11. Garry C Gillette (9 out of 9 patents)

12. Wayne H Miller (9 out of 32 patents)

13. Philip Theodore Kuglin (8 out of 8 patents)

14. Kenneth R Wilsher (8 out of 18 patents)

15. William A Fritzsche (6 out of 14 patents)

Core Competencies:

Integrated Circuit Testing

Clock Signal Generator

Semiconductor Diagnostics

Timing Calibration

Photon Emission Detection

Test Socket Calibration

Jitter Testing

High-Speed Testing

Loadboard Enhancements

Programmable Test Systems

Optical Testing

Power Supply Management

253 patents: Sort by Forward Citations

1. 8649993 - Multi-domain execution of tests on electronic devices (2014-02-11),

2. 8504867 - High resolution clock signal generator (2013-08-06),

3. 8295182 - Routed event test system and method (2012-10-23),

4. 7810005 - Method and system for correcting timing errors in high data rate automated test equipment (2010-10-05),

5. 7805628 - High resolution clock signal generator (2010-09-28),

6. 7765443 - Test systems and methods for integrated circuit devices (2010-07-27),

7. 7761751 - Test and diagnosis of semiconductors (2010-07-20),

8. 7627790 - Apparatus for jitter testing an IC (2009-12-01),

9. 7615990 - Loadboard enhancements for automated test equipment (2009-11-10),

10. 7532014 - LRL vector calibration to the end of the probe needles for non-standard probe cards for ATE RF testers (2009-05-12),

11. 7496467 - Automatic test equipment operating architecture (2009-02-24),

12. 7492181 - Method and device for enabling the measurement of device under test voltages using a testing instrument of limited range (2009-02-17),

13. 7488937 - Method and apparatus for the improvement of material/voltage contrast (2009-02-10),

14. 7471753 - Serializer clock synthesizer (2008-12-30),

15. 7471100 - Semiconductor integrated circuit tester with interchangeable tester module (2008-12-30),

Credence Systems Corporation, based in Milpitas, California, specializes in automated test equipment for the semiconductor industry. The company focuses on developing advanced solutions for integrated circuit testing, ensuring precision in timing calibration and diagnostics. Their technology encompasses various critical areas, including clock signal generation, jitter testing, and photon emission detection. Credence Systems is dedicated to enhancing the efficiency and accuracy of high-speed testing processes, supporting the evolving needs of semiconductor manufacturers.

Profile summary based on public USPTO records.

Company Badge

USPTO Data Jan 1 1976 - Sep 29 2026

Credence Systems Corporation

253 Patents

#19 in Milpitas, CA

#358 in California

#1,692 in US

#3,447 in the World

Milpitas, CA, United States of America

Credence Systems Corporation

Forward Citations = 3,465

215 inventors:

Paul Dana Wohlfarth (15 out of 17 patents)

Burnell G West (14 out of 37 patents)

Steven Kasapi (13 out of 24 patents)

4. Brian J Arkin (12 out of 14 patents)

5. Charles A Miller (11 out of 119 patents)

Please report any incorrect information to [email protected]

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