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Milpitas, CA, United States of America

Credence Systems Corporation

USPTO Granted Patents = 253

Forward Citations = 3,430

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215 inventors (with patents filed for the assignee):

Paul Dana Wohlfarth (15 out of 17 patents)

Burnell G West (14 out of 37 patents)

Steven Kasapi (13 out of 24 patents)

4. Brian J Arkin (12 out of 14 patents)

5. Charles A Miller (11 out of 119 patents)

6. Bryan J Dinteman (11 out of 12 patents)

7. Gary J Lesmeister (11 out of 11 patents)

8. Theodore R Lundquist (9 out of 24 patents)

9. Jeffrey D Currin (9 out of 9 patents)

10. Lawrence A Kraus (9 out of 9 patents)

11. Garry C Gillette (9 out of 9 patents)

12. Wayne H Miller (9 out of 32 patents)

13. Philip Theodore Kuglin (8 out of 8 patents)

14. Kenneth R Wilsher (8 out of 18 patents)

15. William A Fritzsche (6 out of 14 patents)

Core Competencies:

Automated Test Equipment

Integrated Circuit Testing

High Resolution Clock Generators

Photon Emission Detection

Signal Measurement Systems

Jitter Testing

Voltage Deviation Detection

Calibration Systems

Multi-Domain Test Execution

High-Speed Serial Device Testing

Particle Beam Systems

Non-Invasive Diagnostics

253 patents: Sort by Forward Citations

1. 8649993 - Multi-domain execution of tests on electronic devices (2014-02-11),

2. 8504867 - High resolution clock signal generator (2013-08-06),

3. 8295182 - Routed event test system and method (2012-10-23),

4. 7810005 - Method and system for correcting timing errors in high data rate automated test equipment (2010-10-05),

5. 7805628 - High resolution clock signal generator (2010-09-28),

6. 7765443 - Test systems and methods for integrated circuit devices (2010-07-27),

7. 7761751 - Test and diagnosis of semiconductors (2010-07-20),

8. 7627790 - Apparatus for jitter testing an IC (2009-12-01),

9. 7615990 - Loadboard enhancements for automated test equipment (2009-11-10),

10. 7532014 - LRL vector calibration to the end of the probe needles for non-standard probe cards for ATE RF testers (2009-05-12),

11. 7496467 - Automatic test equipment operating architecture (2009-02-24),

12. 7492181 - Method and device for enabling the measurement of device under test voltages using a testing instrument of limited range (2009-02-17),

13. 7488937 - Method and apparatus for the improvement of material/voltage contrast (2009-02-10),

14. 7471753 - Serializer clock synthesizer (2008-12-30),

15. 7471100 - Semiconductor integrated circuit tester with interchangeable tester module (2008-12-30),

Credence Systems Corporation is a leading global provider of automated test equipment (ATE) solutions for the semiconductor industry. With over three decades of experience, Credence offers a comprehensive portfolio of test solutions designed to meet the evolving needs of semiconductor manufacturers. Their advanced ATE systems enable efficient testing and evaluation of integrated circuits, helping customers accelerate time-to-market and reduce costs. Credence Systems Corporation is committed to delivering cutting-edge technology and exceptional customer support to drive innovation in the semiconductor industry.

This text is generated by artificial intelligence and may not be accurate.

Company Badge

USPTO Data Jan 1 1976 - Dec 9 2025

253 Patents

#17 in Milpitas, CA

#363 in California

#1,626 in US

#3,327 in the World

Milpitas, CA, United States of America

Credence Systems Corporation

Forward Citations = 3,430

215 inventors:

Paul Dana Wohlfarth (15 out of 17 patents)

Burnell G West (14 out of 37 patents)

Steven Kasapi (13 out of 24 patents)

4. Brian J Arkin (12 out of 14 patents)

5. Charles A Miller (11 out of 119 patents)

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