The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 01, 2007
Filed:
Aug. 24, 2004
Angarai T. Sivaram, Saratoga, CA (US);
Burnell G. West, Half Moon Bay, CA (US);
Howard Maassen, San Jose, CA (US);
Angarai T. Sivaram, Saratoga, CA (US);
Burnell G. West, Half Moon Bay, CA (US);
Howard Maassen, San Jose, CA (US);
Credence Systems Corporation, Milpitas, CA (US);
Abstract
A test apparatus implements a method for testing electronic devices that exhibit non-deterministic behavior. The test apparatus includes a high-speed buffer queue for storing data packets. The data packets arrive at one end of the queue and, as they exit at the other end, are compared against expect data packets stored in memory. If the data packet exiting the buffer queue corresponds to response signals generated by the device under test during a non-deterministic (e.g., idle) state, the expect data packet is not retrieved from memory and the comparison is not made.