The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 22, 2007
Filed:
Apr. 14, 2004
Burnell G. West, Half Moon Bay, CA (US);
Rodolfo E. Garcia, San Jose, CA (US);
Burnell G. West, Half Moon Bay, CA (US);
Rodolfo E. Garcia, San Jose, CA (US);
Credence Systems Corporation, Milpitas, CA (US);
Abstract
A test apparatus including a means for sending a first test pattern to a device under test (DUT), where the first test pattern is a part of a planned sequence of tests, and further including a means for evaluating the test results received from the DUT, and a method of testing are described. The test results may include anomalous data indicative of a defect in the DUT. If so, a second test pattern that is not part of the planned sequence of tests is selected. The second test pattern is selected based on a diagnosis of the anomalous data by the test apparatus.