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For the Inventor, By the Inventor

Mountain View, CA, United States of America

Fairchild Camera and Instrument Corp.


USPTO Granted Patents = 335

Forward Citations = 5,981

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253 inventors (with patents filed for the assignee):

goldMedal William I Lehrer (16 out of 18 patents)

silverMedal Madhukar B Vora (14 out of 61 patents)

bronzeMedal John A Kurtz (9 out of 11 patents)

4.  Ramesh C Varshney (9 out of 14 patents)

5.  Donald E Cousens (9 out of 10 patents)

6.  William H Herndon (8 out of 15 patents)

7.  Hemraj K Hingarh (7 out of 12 patents)

8.  William S Phy (7 out of 15 patents)

9.  John M Pierce (7 out of 17 patents)

10.  Robert L Berry (7 out of 7 patents)

11.  Gilbert F Amelio (6 out of 7 patents)

12.  Andrew C Tickle (6 out of 6 patents)

13.  Mark D Dufour (6 out of 7 patents)

14.  James R Kuo (5 out of 36 patents)

15.  Michelangelo Delfino (5 out of 20 patents)


Core Competencies:
Base-Coupled Transistor Logic
Integrated Circuit Testing
Line-Scan Image Sensor
Semiconductor Chip Package
Temperature Compensated Sense Amplifier
Charge Coupled Device
Robotic Hand Manipulation
Analog-Digital Converter
Memory Cell Power Scavenging
Low Pressure Chemical Vapor Deposition
Multilayer Glass Passivation
High Voltage Analog Switch

335 patents:

1. 5166094 - Method of fabricating a base-coupled transistor logic (1992-11-24),
2. 5117276 - High performance interconnect system for an integrated circuit (1992-05-26),
3. 4972251 - Multilayer glass passivation structure and method for forming the same (1990-11-20),
4. 4947230 - Base-coupled transistor logic (1990-08-07),
5. 4920071 - High temperature interconnect system for an integrated circuit (1990-04-24),
6. 4918506 - Selectable resolution line-scan image sensor (1990-04-17),
7. 4912344 - TTL output stage having auxiliary drive to pull-down transistor (1990-03-27),
8. 4888300 - Submerged wall isolation of silicon islands (1989-12-19),
9. 4864228 - Electron beam test probe for integrated circuit testing (1989-09-05),
10. 4833521 - Means for reducing signal propagation losses in very large scale (1989-05-23),
11. 4829363 - Structure for inhibiting dopant out-diffusion (1989-05-09),
12. 4796080 - Semiconductor chip package configuration and method for facilitating its (1989-01-03),
13. 4789835 - Control of signal timing apparatus in automatic test systems using (1988-12-06),
14. 4764925 - Method and apparatus for testing integrated circuits (1988-08-16),
15. 4755962 - Microprocessor having multiplication circuitry implementing a modified (1988-07-05),
Fairchild Camera and Instrument Corp. is a leading company specializing in the production of cameras and precision instruments. With a rich history spanning several decades, Fairchild Camera and Instrument Corp. has established itself as a pioneer in the industry, consistently delivering high-quality products to its global customers. Through continuous innovation and technological advancements, the company aims to enhance the world's imaging and measurement capabilities. Visit our website to explore our innovative solutions and learn more about our impressive product portfolio.
This text is generated by artificial intelligence and may not be accurate.

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USPTO Data Jan 1 1976 - Dec 9 2025

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335 Patents

#13 in Mountain View, CA

#287 in California

#1,281 in US

#2,617 in the World

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Mountain View, CA, United States of America

Fairchild Camera and Instrument Corp.

Forward Citations = 5,981

253 inventors:

goldMedal William I Lehrer (16 out of 18 patents)

silverMedal Madhukar B Vora (14 out of 61 patents)

bronzeMedal John A Kurtz (9 out of 11 patents)

4.  Ramesh C Varshney (9 out of 14 patents)

5.  Donald E Cousens (9 out of 10 patents)

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