The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 17, 1990
Filed:
Sep. 13, 1985
Rudolph H Dyck, Palo Alto, CA (US);
Fairchild Camera & Instrument Corporation, Mountain View, CA (US);
Abstract
A line scan image sensor capable of operating at several different spatial sampling frequencies is provided by utilizing a line scanning array having sampling photoelements of different surface areas. The spatial sampling frequency of the sensor can be varied by selectively combining the charge packets generated by the individual photoelements. In a preferred embodiment, photoelements having two different surface areas are used, with the ratio of the smaller surface area with respect to the larger surface area being 1:.sqroot.2. A programmable amplifier is provided to normalize the outputs of photoelements having different surface areas so that a uniform illumination on different photoelements will produce a uniform response. The programmable amplifier can also be programmed to equalize the outputs of the sensor between the different spatial sampling frequency modes.