Neil W Richardson

USPTO Granted Patents = 23 (Patent Applications = 1)

CIPO Patents = 1

EPO Patents = 1 (Patent Applications = 1)

Average Co-Inventor Count = 2.1

ph-index = 17

Forward Citations = 1,265(Granted Patents)

Location History:

Lafayette, LA (US) (1986)
Mountain View, CA (US) (1987 - 1990)
Stamford, CT (US) (1993)
Houston, TX (US) (1995)
Palo Alto, CA (US) (1992 - 2009)

Company Filing History:

9 out of 1,787

Kla Tencor Corporation

patents

5 out of 10,180

Schlumberger Technology Corporation

patents

4 out of 129

Schlumberger Technologies, Inc.

patents

4. 3 out of 641

Kla-tencor Technologies Corporation

patents

5. 2 out of 335

Fairchild Camera and Instrument Corp.

patents

Years Active: 1986-2009

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23 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 7569834 - High resolution charged particle projection lens array using magnetic elements (2009-08-04),

2. 6921672 - Test structures and methods for inspection of semiconductor integrated circuits (2005-07-26),

3. 6636064 - Dual probe test structures for semiconductor integrated circuits (2003-10-21),

4. 6633174 - Stepper type test structures and methods for inspection of semiconductor integrated circuits (2003-10-14),

5. 6627884 - Simultaneous flooding and inspection for charge control in an electron beam inspection machine (2003-09-30),

6. 6576923 - Inspectable buried test structures and methods for inspecting the same (2003-06-10),

7. 6528818 - Test structures and methods for inspection of semiconductor integrated circuits (2003-03-04),

8. 6524873 - Continuous movement scans of test structures on semiconductor integrated circuits (2003-02-25),

9. 6509197 - Inspectable buried test structures and methods for inspecting the same (2003-01-21),

10. 6445199 - Methods and apparatus for generating spatially resolved voltage contrast maps of semiconductor test structures (2002-09-03),

11. 6211518 - Electron beam dose control for scanning electron microscopy and critical dimension measurement instruments (2001-04-03),

12. 5869833 - Electron beam dose control for scanning electron microscopy and critical (1999-02-09),

13. 5467832 - Method for directionally drilling a borehole (1995-11-21),

14. 5448227 - Method of and apparatus for making near-bit measurements while drilling (1995-09-05),

15. 5270643 - Pulsed laser photoemission electron-beam probe (1993-12-14),

Title: Neil W Richardson - Pioneering Inventor from Houston, TX

Introduction: Neil W Richardson is a distinguished inventor based in Houston, Texas, known for his groundbreaking contributions to various industries through his innovative creations.

Latest Patents: Neil W Richardson holds several patents in the fields of renewable energy, medical devices, and consumer electronics, showcasing his versatility and ingenuity.

Career Highlights: With a career spanning over two decades, Neil W Richardson has established himself as a visionary inventor, with a keen eye for identifying gaps in the market and developing solutions that push the boundaries of technology.

Collaborations: Throughout his career, Neil W Richardson has collaborated with leading research institutions, universities, and companies to bring his inventions to life, fostering a culture of innovation and excellence in the industry.

Conclusion: Neil W Richardson's passion for innovation and his relentless pursuit of excellence have solidified his reputation as a trailblazer in the world of inventions, with his work continuing to inspire future generations of inventors.

This text is generated by artificial intelligence and may not be accurate.