Company Filing History:

13 out of 1,787

Kla Tencor Corporation

Years Active: 2011-2023

where 'Filed Patents' based on already Granted Patents

16 patents (USPTO):Sort by Forward Citations

Abstract keywords

1. 11783470 - Design-assisted inspection for DRAM and 3D NAND devices (2023-10-10),

2. 11308606 - Design-assisted inspection for DRAM and 3D NAND devices (2022-04-19),

3. 11270430 - Wafer inspection using difference images (2022-03-08),

4. 10923317 - Detecting defects in a logic region on a wafer (2021-02-16),

5. 10600177 - Nuisance reduction using location-based attributes (2020-03-24),

6. 10599944 - Visual feedback for inspection algorithms and filters (2020-03-24),

7. 10395359 - Adaptive local threshold and color filtering (2019-08-27),

8. 10339262 - System and method for defining care areas in repeating structures of design data (2019-07-02),

9. 9704234 - Adaptive local threshold and color filtering (2017-07-11),

10. 9619876 - Detecting defects on wafers based on 2D scatter plots of values determined for output generated using different optics modes (2017-04-11),

11. 9442077 - Scratch filter for wafer inspection (2016-09-13),

12. 9224660 - Tuning wafer inspection recipes using precise defect locations (2015-12-29),

13. 9053527 - Detecting defects on a wafer (2015-06-09),

14. 8989479 - Region based virtual fourier filter (2015-03-24),

15. 8775101 - Detecting defects on a wafer (2014-07-08),

Title: Junqing Huang: Innovator in Memory Device Inspection

Introduction

Junqing Huang is a prominent inventor based in Fremont, CA (US). He has made significant contributions to the field of memory device inspection, holding a total of 16 patents. His work focuses on enhancing the efficiency and accuracy of inspection processes for advanced memory technologies.

Latest Patents

One of Junqing Huang's latest patents is titled "Design-assisted inspection for DRAM and 3D NAND devices." This patent outlines systems and methods for inspecting DRAM and 3D NAND devices. The process involves receiving an image of the wafer based on the output from an inspection tool. Geometric measurements of the design of multiple memory devices on the wafer are analyzed. A care area with higher inspection sensitivity is then determined based on these geometric measurements.

Career Highlights

Throughout his career, Junqing Huang has worked with notable companies such as Kla Tencor Corporation and Kla Corporation. His experience in these organizations has allowed him to develop innovative solutions that address the challenges in memory device inspection.

Collaborations

Some of his coworkers include Lisheng Gao and Hucheng Lee. Their collaboration has contributed to the advancement of technologies in the field.

Conclusion

Junqing Huang's contributions to the field of memory device inspection through his patents and collaborations highlight his role as an influential inventor. His work continues to impact the industry positively.

This text is generated by artificial intelligence and may not be accurate.

Please report any incorrect information to support@idiyas.com

3 patents pending (EPO):

Please report any incorrect information to support@idiyas.com

Inventor’s Patent Attorneys refers to legal professionals with specialized expertise in representing inventors throughout the patent process. These attorneys assist inventors in navigating the complexities of patent law, including filing patent applications, conducting patent searches, and protecting intellectual property rights. They play a crucial role in helping inventors secure patents for their innovative creations.