Haelen, Netherlands

Jacobus Burghoorn

This inventor holds 17 USPTO granted patents, primarily in Lithography Technology. Top assignee: Asml Netherlands B.v.. Active years: 2003-2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jacobus Burghoorn. Retrieved from https://idiyas.com/inventor/jacobus-burghoorn

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 70.6

Average Co-Inventor Count = 4.1

ph-index = 7

Forward Citations = 114(Granted Patents)


Company Filing History:


Years Active: 2003-2014

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Areas of Expertise:
Lithographic Apparatus
Device Manufacturing
Alignment Systems
Marker Structure
Exposure Apparatus
Tilted Focus
Interferometric Alignment
Multi-Layered Substrate
Substrate Production
Vacuum-Based Systems
17 patents (USPTO):Explore Patents

Title: Jacobus Burghoorn - Innovative Mind from Haelen, NL

Introduction: Jacobus Burghoorn is a visionary inventor hailing from Haelen, Netherlands, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Jacobus Burghoorn holds several patents in various technological domains, showcasing his versatility and creativity in inventing new solutions to modern challenges.

Career Highlights: Throughout his illustrious career, Jacobus Burghoorn has consistently pushed the boundaries of innovation, with his inventions revolutionizing industries and improving the lives of many around the world.

Collaborations: Jacobus Burghoorn has collaborated with leading research institutions, universities, and companies to further develop and implement his innovative ideas, demonstrating his commitment to driving progress through teamwork and cooperation.

Conclusion: Jacobus Burghoorn's passion for innovation and his relentless pursuit of excellence have solidified his reputation as a pioneering inventor in the global technological landscape, inspiring future generations to continue pushing the boundaries of what is possible.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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