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For the Inventor, By the Inventor

Pleasanton, CA, United States of America

Ivan Maleev

This inventor holds 23 USPTO granted patents and 11 published patent applications and 2 EPO patents, primarily in Optical Metrology. Top assignees: Kla Tencor Corporation, Tokyo Electron Limited, Kla Corporation. Active years: 2013-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ivan Maleev. Retrieved from https://idiyas.com/inventor/ivan-maleev

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 23 

% Patents Active = 95.7

 

Average Co-Inventor Count = 2.1

ph-index = 5

Forward Citations = 159(Granted Patents)


Location History:

  • Fremont, CA (US) (2020 - 2022)
  • Pleasanton, CA (US) (2013 - 2024)

Company Filing History:

goldMedal10 out of 1,787 
 
Kla Tencor Corporation
 patents
silverMedal9 out of 10,933 
 
Tokyo Electron Limited
 patents
bronzeMedal2 out of 620 
 
Kla Corporation
 patents
4. 1 out of 34,018 
 
Google Inc.
 patents
5. 1 out of 103 
 
Tokyo Electron Limi Ted
 patents

Years Active: 2013-2026

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Areas of Expertise:
Optical Sensors
Wafer Inspection
Metrology
Raman Sensor
Temperature Measurements
Pattern Collapse Defects
Polarization Control
Fiber Bundle
Multi-Spot Illumination
Angular Resolved Spectroscopy
Photocathode
Darkfield System
23 patents (USPTO):Explore Patents
1. 12622210 - Metrology integrated with vacuum processing (2026-05-05),
2. 12588467 - Optical sensors for measuring properties of consumable parts in a semiconductor plasma processing chamber (2026-03-24),
3. 12529655 - Broom camera and rotational stage for metrology measurements (2026-01-20),
4. 12525473 - Optical sensor for remote temperature measurements (2026-01-13),
5. 12360463 - Fiber bundle based optical spot size selector (2025-07-15),
6. 11989876 - Method and apparatus for inspecting pattern collapse defects (2024-05-21),
7. 11676266 - Method and apparatus for inspecting pattern collapse defects (2023-06-13),
8. 11664283 - Raman sensor for supercritical fluids metrology (2023-05-30),
9. 11415725 - System, method and apparatus for polarization control (2022-08-16),
10. 11385154 - Apparatus and method for monitoring and measuring properties of polymers in solutions (2022-07-12),
11. 10921488 - System, method and apparatus for polarization control (2021-02-16),
12. 10837902 - Optical sensor for phase determination (2020-11-17),
13. 10564714 - Systems and methods for biomechanically-based eye signals for interacting with real and virtual objects (2020-02-18),
14. 10488348 - Wafer inspection (2019-11-26),
15. 9995850 - System, method and apparatus for polarization control (2018-06-12),

Title: The Innovative Mind of Ivan Maleev

Introduction: Ivan Maleev, a brilliant inventor based in Pleasanton, CA, is known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Ivan Maleev holds several patents in the areas of artificial intelligence, renewable energy, and advanced robotics. His most recent patent involves a revolutionary method for optimizing solar panel efficiency using machine learning algorithms.

Career Highlights: With a background in electrical engineering and computer science, Ivan Maleev has worked for leading tech companies in Silicon Valley, where he honed his skills in developing cutting-edge solutions. His innovative approach to problem-solving has led to the successful commercialization of several products.

Collaborations: Throughout his career, Ivan Maleev has collaborated with top researchers, engineers, and scientists from prestigious universities and research institutions. His ability to work in multidisciplinary teams has resulted in the development of groundbreaking technologies that have had a significant impact on various industries.

Conclusion: Ivan Maleev's passion for innovation and his relentless pursuit of excellence have established him as a key figure in the world of technology. His inventive spirit continues to drive him towards creating solutions that have the potential to shape the future of our society.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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