The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2026

Filed:

Aug. 16, 2022
Applicant:

Tokyo Electron Limited, Tokyo, JP;

Inventors:

Ivan Maleev, Fremont, CA (US);

Shin-Yee Lu, Fremont, CA (US);

Dimitri Klyachko, Fremont, CA (US);

Ching Ling Meng, Sunnyvale, CA (US);

Xinkang Tian, Fremont, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/68 (2006.01); H01J 37/32 (2006.01); H01L 21/677 (2006.01);
U.S. Cl.
CPC ...
H01L 21/681 (2013.01); H01J 37/32642 (2013.01); H01L 21/67742 (2013.01);
Abstract

A method of manufacturing semiconductor devices includes repeatedly performing a transfer operation which transfers each of a plurality of semiconductor wafers between a substrate handling module and a processing chamber through a wafer access port, the processing chamber including at least one consumable component. Using the processing chamber, a semiconductor manufacturing process is performed on each of the plurality of semiconductor wafers; and detecting an optical signal from the at least one consumable component during a time when the processing chamber is not performing the semiconductor manufacturing process on the wafers.


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