Company Filing History:
2 out of 10,326 
1 out of 15,475 
1 out of 135 
Years Active: 1998-2024
Title: Innovations of Shin-Yee Lu
Introduction
Shin-Yee Lu is a prominent inventor based in Pleasanton, CA (US). He has made significant contributions to the field of defect inspection technology, holding a total of 4 patents. His work focuses on utilizing advanced methodologies to enhance the accuracy and efficiency of defect detection in various samples.
Latest Patents
One of his latest patents is a method and apparatus for inspecting pattern collapse defects. This innovative method involves detecting defects on a sample using a defect inspection apparatus. The process begins with organizing an image data set that includes both defect data and non-defect data. A convolutional neural network (CNN) model is then defined and trained based on this image data set. The defects on the sample are identified using inspection data from the defect inspection apparatus in conjunction with the trained CNN model. The sample typically consists of uniformly repeating structures, and the inspection data is generated by filtering out signals from these structures.
Career Highlights
Shin-Yee Lu has worked with notable organizations, including Tokyo Electron Limited and the University of California. His experience in these institutions has allowed him to refine his skills and contribute to groundbreaking advancements in his field.
Collaborations
Throughout his career, Shin-Yee Lu has collaborated with various professionals, including his coworker Ivan Maleev. These collaborations have fostered an environment of innovation and have led to the development of new technologies.
Conclusion
Shin-Yee Lu's contributions to defect inspection technology exemplify the impact of innovative thinking in engineering. His patents and career achievements highlight his dedication to advancing the field and improving inspection methodologies.