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For the Inventor, By the Inventor

San Jose, CA, United States of America

Xinkang Tian

This inventor holds 31 USPTO granted patents and 11 published patent applications, primarily in Optical Metrology. Top assignees: Tokyo Electron Limited, Tokyo Electron Limi Ted, Kla-Tencor Technologies Corporation. Active years: 2009-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Xinkang Tian. Retrieved from https://idiyas.com/inventor/xinkang-tian

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 31 

% Patents Active = 77.4

Average Co-Inventor Count = 3.1

ph-index = 9

Forward Citations = 182(Granted Patents)


Location History:

  • San Jose, CA (US) (2009 - 2023)
  • Fremont, CA (US) (2019 - 2024)

Company Filing History:

goldMedal28 out of 10,904 
 
Tokyo Electron Limited
 patents
silverMedal2 out of 103 
 
Tokyo Electron Limi Ted
 patents
bronzeMedal1 out of 641 
 
Kla-Tencor Technologies Corporation
 patents

Years Active: 2009-2026

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Areas of Expertise:
Optical Sensors
Semiconductor Processing
Hyperspectral Imaging
In-Situ Monitoring
Process Control
Endpoint Detection
Data Acquisition
Etch Stage Measurement
Machine Learning
Vacuum Processing
Defect Inspection
31 patents (USPTO):Explore Patents
1. 12669452 - Hybrid X-ray and optical metrology and navigation (2026-06-30),
2. 12622210 - Metrology integrated with vacuum processing (2026-05-05),
3. 12588467 - Optical sensors for measuring properties of consumable parts in a semiconductor plasma processing chamber (2026-03-24),
4. 12261030 - Normal-incidence in-situ process monitor sensor (2025-03-25),
5. 12165937 - Optical diagnostics of semiconductor process using hyperspectral imaging (2024-12-10),
6. 11961721 - Normal-incidence in-situ process monitor sensor (2024-04-16),
7. 11763161 - Enhanced resolution in semiconductor fabrication data acquisition instruments using machine learning (2023-09-19),
8. 11692874 - Peak alignment for the wavelength calibration of a spectrometer (2023-07-04),
9. 11538723 - Optical diagnostics of semiconductor process using hyperspectral imaging (2022-12-27),
10. 11538722 - Optical diagnostics of semiconductor process using hyperspectral imaging (2022-12-27),
11. 10978278 - Normal-incident in-situ process monitor sensor (2021-04-13),
12. 10910201 - Synthetic wavelengths for endpoint detection in plasma etching (2021-02-02),
13. 10837902 - Optical sensor for phase determination (2020-11-17),
14. 10692705 - Advanced optical sensor and method for detecting an optical event in a light emission signal in a plasma chamber (2020-06-23),
15. 10453653 - Endpoint detection algorithm for atomic layer etching (ALE) (2019-10-22),

Title: The Innovative Journey of Xinkang Tian

Introduction: Xinkang Tian, a visionary inventor based in San Jose, CA, has made significant contributions to the field of technology with his groundbreaking inventions and patents.

Latest Patents: Xinkang Tian holds several patents in the areas of artificial intelligence, machine learning, and robotics, showcasing his commitment to pushing the boundaries of innovation.

Career Highlights: With a background in computer science and engineering, Xinkang Tian has a successful track record of developing cutting-edge technologies that have revolutionized various industries. His keen eye for identifying gaps in the market and creating solutions has set him apart as a leading innovator.

Collaborations: Throughout his career, Xinkang Tian has collaborated with top research institutions, leading companies, and talented individuals to bring his ideas to life. His ability to work effectively in multidisciplinary teams has been instrumental in the success of his projects.

Conclusion: Xinkang Tian's passion for innovation, coupled with his technical expertise, has established him as a prominent figure in the world of technology. His relentless pursuit of excellence continues to inspire the next generation of inventors and entrepreneurs.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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