Los Gatos, CA, United States of America

Ian R Smith

This inventor holds 39 USPTO granted patents, primarily in Semiconductor Metrology. Top assignees: Kla-Tencor Technologies Corporation, Park Scientific Instruments, Siscan Systems, Inc.. Active years: 1987-2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ian R Smith. Retrieved from https://idiyas.com/inventor/ian-r-smith

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 94.9

Average Co-Inventor Count = 3.7

ph-index = 21

Forward Citations = 1,313(Granted Patents)


Location History:

  • Los Gatos, CA (US) (1987 - 2011)
  • Sandisfield, MA (US) (2022)

Company Filing History:


Years Active: 1987-2022

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Areas of Expertise:
Overlay Error Detection
Scanning Probe Microscope
Semiconductor Metrology
Calibration Standards
Optical Systems
Electrical Testing
Dimensional Calibration
Defect Classification
Metrology Systems
Ink Jet Printing
Signal-to-Noise Ratio
39 patents (USPTO):Explore Patents

Title: Ian R Smith: Inventions and Collaborations with Industry Leaders

Introduction:

Ian R Smith, based in Los Gatos, CA (US), is a prolific inventor and contributor to technological advancements. With an impressive portfolio comprising 39 patents, he has made significant contributions to various industries. This article delves into his latest patents, career highlights, and collaborative efforts with industry leaders.

Latest Patents:

One of Ian R Smith's recent patented inventions is the frayed cable scaling tool. This innovative tool utilizes a frayed cable end, which acts as a wire brush, combined with a collar or other measures to prevent excessive unraveling. When powered by a pneumatic saw power tool, it becomes highly effective in removing scale, rust, carbon, or other debris. Its flexible design allows for vigorous random motion, making it ideal for scrubbing purposes. In certain applications, the cable and/or collar can be enclosed in a guide tube for improved control and efficiency.

Another notable patent is the apparatus and methods for detecting overlay errors using scatterometry. These techniques involve the use of targets designed to determine overlay errors between two layers of a sample. By illuminating the targets with electromagnetic radiation and analyzing the resulting spectra at different diffraction orders, it becomes possible to detect any overlay errors. This scatterometry-based approach offers high precision and accuracy in determining the alignment of first and second structures within the sample.

Career Highlights:

Throughout his career, Ian R Smith has demonstrated exceptional innovation and problem-solving skills. His 39 patents signify his remarkable ability to turn ideas into tangible inventions. Ian has made significant contributions to companies such as KLA-Tencor Technologies Corporation and Park Scientific Instruments. His work has propelled advancements in various industries, ranging from manufacturing to metrology.

Collaborations:

Ian R Smith has had the opportunity to collaborate with esteemed colleagues during his professional journey. Notable among them are Walter Dean Mieher and Ady Levy. These collaborations have proven fruitful in fostering a creative environment where cutting-edge ideas can flourish. By working closely with industry leaders, Ian has been able to combine diverse perspectives and expertise, resulting in improved products and processes.

Conclusion:

Ian R Smith's passion for innovation and tireless pursuit of excellence have translated into a remarkable portfolio of patented inventions. From the frayed cable scaling tool to the scatterometry-based overlay error detection technique, his contributions have brought significant advancements to various industries. Collaborations with prominent figures in the field further exemplify his commitment to pushing the boundaries of technological possibilities. With more endeavors on the horizon, Ian R Smith continues to make a lasting impact on the world of inventions and patents.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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