Forward Citations = 137

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3 inventors (with patents filed for the assignee):

Ian R Smith (5 out of 39 patents)

James T Lindow (4 out of 9 patents)

Simon D Bennett (4 out of 5 patents)

5 patents: Sort by Forward Citations

1. 5184021 - Method and apparatus for measuring the dimensions of patterned features (1993-02-02),

2. 4847823 - Method and apparatus for reading or measuring magneto-optical storage (1989-07-11),

3. 4748335 - Method and aparatus for determining surface profiles (1988-05-31),

4. 4707610 - Method and apparatus for measuring surface profiles (1987-11-17),

5. 4634880 - Confocal optical imaging system with improved signal-to-noise ratio (1987-01-06),

Siscan Systems, Inc. is a leading provider of cutting-edge scanning technology for various industries. Our advanced systems offer high-quality imaging solutions for security, healthcare, transportation, and more. With a strong focus on innovation and customer satisfaction, we strive to deliver top-of-the-line products that meet the needs of our clients. Visit our website to learn more about our services and solutions.

Profile summary based on public USPTO records.

Company Badge

USPTO Data Jan 1 1976 - Oct 6 2026

5 Patents

#93 in Campbell, CA

#12,058 in California

#51,570 in US

Campbell, CA, United States of America

Siscan Systems, Inc.

Forward Citations = 137

3 inventors:

Ian R Smith (5 out of 39 patents)

James T Lindow (4 out of 9 patents)

Simon D Bennett (4 out of 5 patents)

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