Average Co-Inventor Count = 5.8

ph-index = 19

Forward Citations = 1,107(Granted Patents)

DiyaCoin

= 0.53

Inventors with similar research interests:

Location History:

Chyofu, JP (1992)
Choufu, JP (1997 - 1998)
Tokyo, JP (1992 - 2008)
Cyofu, JP (2003 - 2008)
Chofu, JP (1989 - 2013)
Mitaka, JP (2005 - 2020)

Company Filing History:

Hitachi-high-technologies Corporation

patents

1 out of 3,781

Renesas Technology Corp.

patents

4. 1 out of 1,116

Hitachi High-tech Corporation

patents

where one patent can have more than one assignee

Years Active: 1989-2020

where 'Filed Patents' based on already Granted Patents

79 patents (USPTO):Sort by Forward Citations

Abstract keywords

1. 10840060 - Scanning electron microscope and sample observation method (2020-11-17),

2. 9991092 - Scanning electron microscope and sample observation method (2018-06-05),

3. 8604430 - Method and an apparatus of an inspection system using an electron beam (2013-12-10),

4. 8212227 - Electron beam exposure or system inspection or measurement apparatus and its method and height detection apparatus (2012-07-03),

5. 8134125 - Method and apparatus of an inspection system using an electron beam (2012-03-13),

6. 7982188 - Apparatus and method for wafer pattern inspection (2011-07-19),

7. 7952074 - Method and apparatus for inspecting integrated circuit pattern (2011-05-31),

8. 7692144 - Electron beam exposure or system inspection or measurement apparatus and its method and height detection apparatus (2010-04-06),

9. 7526747 - Inspection method and inspection system using charged particle beam (2009-04-28),

10. 7439506 - Method and an apparatus of an inspection system using an electron beam (2008-10-21),

11. 7439504 - Pattern inspection method and apparatus using electron beam (2008-10-21),

12. 7417444 - Method and apparatus for inspecting integrated circuit pattern (2008-08-26),

13. 7411190 - Inspection system, inspection method, and process management method (2008-08-12),

14. 7397031 - Method of inspecting a circuit pattern and inspecting instrument (2008-07-08),

15. 7348558 - Charged particle beam apparatus and automatic astigmatism adjustment method (2008-03-25),

Sure, I can help you with that. Just to confirm, you are looking for an article about inventor Hiroyuki Shinada, who is located in Chofu, JP, and has 79 patents. His latest patents include a Scanning Electron Microscope and Sample Observation Method. He has worked in companies such as Hitachi, Ltd. and Hitachi High-Technologies Corporation, with coworkers like Atsuko Takafuji and Takashi Hiroi. Let's structure the article as follows:

Title: Exploring the Inventive Mind of Hiroyuki Shinada

Introduction: Introduce Hiroyuki Shinada as a prolific inventor based in Chofu, JP, with a remarkable portfolio of 79 patents. Highlight his dedication to innovation in the field of scanning electron microscopy.

Latest Patents: Discuss Hiroyuki Shinada's groundbreaking patents, particularly focusing on his innovative work with a Scanning Electron Microscope and Sample Observation Method. Detail how his inventions have revolutionized scanning technology by optimizing scanning line density based on sample characteristics.

Career Highlights: Explore his career achievements at renowned companies like Hitachi, Ltd. and Hitachi High-Technologies Corporation. Emphasize his significant contributions to the advancement of technology in these organizations.

Collaborations: Shed light on Hiroyuki Shinada's collaborative spirit by mentioning key coworkers such as Atsuko Takafuji and Takashi Hiroi. Describe how teamwork has played a pivotal role in his inventive journey.

Conclusion: Conclude the article by summarizing the extraordinary innovations of Hiroyuki Shinada. Highlight his impact on the field of scanning electron microscopy and emphasize his ongoing commitment to pioneering technological solutions.

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