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For the Inventor, By the Inventor

Chofu, Japan

Hiroyuki Shinada

This inventor holds 79 USPTO granted patents and 1 published patent application, primarily in Electron Beam Inspection (CPC class H01J). Top assignees: Hitachi, Ltd., Hitachi-High-Technologies Corporation, Hitachi High-Tech Corporation. Active years: 1989-2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hiroyuki Shinada. Retrieved from https://idiyas.com/inventor/hiroyuki-shinada

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 79 

% Patents Active = 63.3

Average Co-Inventor Count = 5.8

ph-index = 19

Forward Citations = 1,112(Granted Patents)

Forward Citations (Not Self Cited) = 1,037(Dec 10, 2025)


Inventors with similar research interests:


Location History:

  • Chyofu, JP (1992)
  • Choufu, JP (1997 - 1998)
  • Tokyo, JP (1992 - 2008)
  • Cyofu, JP (2003 - 2008)
  • Chofu, JP (1989 - 2013)
  • Mitaka, JP (2005 - 2020)

Company Filing History:

goldMedal72 out of 42,726 
 
Hitachi, Ltd.
 patents
silverMedal6 out of 2,874 
 
Hitachi-High-Technologies Corporation
 patents
bronzeMedal1 out of 1,380 
 
Hitachi High-Tech Corporation
 patents
4. 1 out of 3,781 
 
Renesas Technology Corp.
 patents
where one patent can have more than one assignee

Years Active: 1989-2020

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Areas of Expertise:
Electron Beam
Inspection Method
Charged Particle Beam
Integrated Circuit
Wafer Pattern
Surface Height Calculator
Astigmatism Adjustment
Semiconductor Manufacturing
Pattern Inspection
Measurement Apparatus
Sample Observation
Process Management
79 patents (USPTO):Explore Patents
1. 10840060 - Scanning electron microscope and sample observation method (2020-11-17),
2. 9991092 - Scanning electron microscope and sample observation method (2018-06-05),
3. 8604430 - Method and an apparatus of an inspection system using an electron beam (2013-12-10),
4. 8212227 - Electron beam exposure or system inspection or measurement apparatus and its method and height detection apparatus (2012-07-03),
5. 8134125 - Method and apparatus of an inspection system using an electron beam (2012-03-13),
6. 7982188 - Apparatus and method for wafer pattern inspection (2011-07-19),
7. 7952074 - Method and apparatus for inspecting integrated circuit pattern (2011-05-31),
8. 7692144 - Electron beam exposure or system inspection or measurement apparatus and its method and height detection apparatus (2010-04-06),
9. 7526747 - Inspection method and inspection system using charged particle beam (2009-04-28),
10. 7439506 - Method and an apparatus of an inspection system using an electron beam (2008-10-21),
11. 7439504 - Pattern inspection method and apparatus using electron beam (2008-10-21),
12. 7417444 - Method and apparatus for inspecting integrated circuit pattern (2008-08-26),
13. 7411190 - Inspection system, inspection method, and process management method (2008-08-12),
14. 7397031 - Method of inspecting a circuit pattern and inspecting instrument (2008-07-08),
15. 7348558 - Charged particle beam apparatus and automatic astigmatism adjustment method (2008-03-25),

Sure, I can help you with that. Just to confirm, you are looking for an article about inventor Hiroyuki Shinada, who is located in Chofu, JP, and has 79 patents. His latest patents include a Scanning Electron Microscope and Sample Observation Method. He has worked in companies such as Hitachi, Ltd. and Hitachi High-Technologies Corporation, with coworkers like Atsuko Takafuji and Takashi Hiroi. Let's structure the article as follows:

Title: Exploring the Inventive Mind of Hiroyuki Shinada

Introduction: Introduce Hiroyuki Shinada as a prolific inventor based in Chofu, JP, with a remarkable portfolio of 79 patents. Highlight his dedication to innovation in the field of scanning electron microscopy.

Latest Patents: Discuss Hiroyuki Shinada's groundbreaking patents, particularly focusing on his innovative work with a Scanning Electron Microscope and Sample Observation Method. Detail how his inventions have revolutionized scanning technology by optimizing scanning line density based on sample characteristics.

Career Highlights: Explore his career achievements at renowned companies like Hitachi, Ltd. and Hitachi High-Technologies Corporation. Emphasize his significant contributions to the advancement of technology in these organizations.

Collaborations: Shed light on Hiroyuki Shinada's collaborative spirit by mentioning key coworkers such as Atsuko Takafuji and Takashi Hiroi. Describe how teamwork has played a pivotal role in his inventive journey.

Conclusion: Conclude the article by summarizing the extraordinary innovations of Hiroyuki Shinada. Highlight his impact on the field of scanning electron microscopy and emphasize his ongoing commitment to pioneering technological solutions.

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Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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