Location History:
- Los Altos, CA (US) (1978 - 2009)
- Los Altos Hills, CA (US) (1992 - 2015)
- Los Alto Hills, CA (US) (2013 - 2015)
Company Filing History:
13 out of 1,787 
11 out of 50 
8 out of 641 
Years Active: 1978-2015
Title: Innovations and Contributions of George J. Kren
Introduction
George J. Kren, a prominent inventor based in Los Altos, California, has made significant contributions to the field of optical inspection systems. With a remarkable portfolio of 34 patents, Kren has developed innovative technologies that enhance the efficiency and accuracy of wafer inspection processes.
Latest Patents
Among his latest patents, Kren has introduced a system for managing illumination energy during surface inspections of wafers. This invention focuses on mitigating illumination-induced damage while maintaining the signal-to-noise ratio (SNR) of inspection systems. By rotating the wafer at a selected spin frequency, the system optimizes illumination energy based on the radial distance from the center of the wafer. Additionally, Kren has developed a bright-field differential interference contrast (BF-DIC) system, utilizing scanning beams with both round and elliptical cross-sections. This innovative method enhances inspection accuracy by analyzing radial and tangential slopes on the substrate, enabling users to determine wafer shape and local topography features effectively.
Career Highlights
George Kren has made substantial strides in his career, particularly through his work at Kla-Tencor Corporation and Tencor Instruments. At these companies, he has contributed to various technological advancements in optical inspection devices, establishing himself as a leader in the engineering of high-precision measurement systems.
Collaborations
Throughout his career, Kren has collaborated with notable professionals, including Paul J. Sullivan and Christopher F. Bevis. These collaborations have likely played a significant role in enhancing the innovative capabilities of the projects he undertook, leading to the successful development of his patents.
Conclusion
George J. Kren continues to be an influential figure in the field of optical technology. His extensive patent portfolio and innovative contributions reflect his dedication to advancing the capabilities of wafer inspection systems. As he forges ahead with new ideas and inventions, Kren's work undoubtedly paves the way for future advancements in this vital technology.