Plano, TX, United States of America

Duane E Carter

This inventor holds 20 USPTO granted patents, primarily in Semiconductor Processing. Top assignees: Texas Instruments Corporation, Photodigm Inc.. Active years: 1985-2005.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Duane E Carter. Retrieved from https://idiyas.com/inventor/duane-e-carter

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 95.0

Average Co-Inventor Count = 3.2

ph-index = 11

Forward Citations = 851(Granted Patents)


Company Filing History:


Years Active: 1985-2005

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Areas of Expertise:
Coating Thickness Control
Memory Array Formation
Conductive Surface Isolation
Anti-Reflective Coatings
Micromirror Contrast
Plasma-Assisted Etching
Selective Etching
Poly-Silicon Gates
Vacuum Processing
Magnetron Plasma Reactor
Trench Processing
Field Plate Isolation
20 patents (USPTO):Explore Patents

Title: The Inventor Profile of Duane E Carter

Introduction: Duane E Carter is a prolific inventor based in Plano, Texas, known for his innovative contributions in various fields.

Latest Patents: Duane E Carter holds several patents in the areas of technology and engineering, showcasing his continuous dedication to creating novel solutions.

Career Highlights: With a successful career spanning over two decades, Duane E Carter has established himself as a leading figure in the world of inventions, with a focus on practical and impactful creations.

Collaborations: Throughout his career, Duane E Carter has collaborated with industry experts, researchers, and fellow inventors to bring his ideas to life and make a lasting impact on the innovation landscape.

Conclusion: Duane E Carter's passion for innovation and his relentless drive to push the boundaries of what is possible make him a standout figure in the world of inventors, with a legacy that continues to inspire future generations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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