David Lee Brown

This inventor holds 48 USPTO granted patents and 5 published patent applications and 3 EPO patents, primarily in Sensor Inspection Technology. Top assignees: Kla Tencor Corporation, Kla-Tencor Technologies Corporation, Hamamatsu-Photonics K.k.. Active years: 2000-2023.

USPTO Granted Patents = 48 (Patent Applications = 5)

% Patents Active = 89.6

EPO Patents = 3 (Patent Applications = 1)

Average Co-Inventor Count = 4.0

ph-index = 11

Forward Citations = 530(Granted Patents)

Location History:

Sunnyvale, CA (US) (2000 - 2014)
Los Gatos, CA (US) (2014 - 2023)

Company Filing History:

38 out of 1,787

Kla Tencor Corporation

patents

7 out of 641

Kla-Tencor Technologies Corporation

patents

3 out of 3,124

Hamamatsu-Photonics K.k.

Kla-Tencor Coporation

patents

where one patent can have more than one assignee

Years Active: 2000-2023

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Areas of Expertise:

Back-Illuminated Sensor

CCD Sensor Architecture

EUV Inspection System

Scanning Electron Microscope

Low-Noise Sensor

High-Speed Imaging

Photomultiplier Tube

Inline Inspection

TDI Sensor Modules

Laser Pulse Multiplier

Electrical Defects

Metrology

48 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 11719533 - Modulation of scanning velocity during overlay metrology (2023-08-08),

2. 11114491 - Back-illuminated sensor and a method of manufacturing a sensor (2021-09-07),

3. 11114489 - Back-illuminated sensor and a method of manufacturing a sensor (2021-09-07),

4. 10778925 - Multiple column per channel CCD sensor architecture for inspection and metrology (2020-09-15),

5. 10764527 - Dual-column-parallel CCD sensor and inspection systems using a sensor (2020-09-01),

6. 10469782 - Power-conserving clocking for scanning sensors (2019-11-05),

7. 10466212 - Scanning electron microscope and methods of inspecting and reviewing samples (2019-11-05),

8. 10462391 - Dark-field inspection using a low-noise sensor (2019-10-29),

9. 10446696 - Back-illuminated sensor with boron layer (2019-10-15),

10. 10429321 - Apparatus for high-speed imaging sensor data transfer (2019-10-01),

11. 10313622 - Dual-column-parallel CCD sensor and inspection systems using a sensor (2019-06-04),

12. 10269842 - Anti-reflection layer for back-illuminated sensor (2019-04-23),

13. 10197501 - Electron-bombarded charge-coupled device and inspection systems using EBCCD detectors (2019-02-05),

14. 10194108 - Sensor with electrically controllable aperture for inspection and metrology systems (2019-01-29),

15. 10193293 - Semiconductor inspection and metrology system using laser pulse multiplier (2019-01-29),

Title: Inventor David Lee Brown

Introduction: David Lee Brown is a prolific inventor based in Los Gatos, California. He is known for his innovative contributions in various fields.

Latest Patents: David Lee Brown holds several patents in the areas of technology, healthcare, and consumer products. His latest patents focus on advancements in artificial intelligence and sustainable energy solutions.

Career Highlights: Throughout his career, David Lee Brown has been recognized for his groundbreaking inventions that have significantly impacted industries. He has a proven track record of turning innovative ideas into successful products.

Collaborations: David Lee Brown has collaborated with leading companies, research institutions, and universities to bring his inventions to life. His collaborative efforts have resulted in cutting-edge technologies that have revolutionized the market.

Conclusion: David Lee Brown's passion for innovation and dedication to creating impactful solutions have solidified his reputation as a visionary inventor in the industry. His contributions continue to inspire future generations of inventors.