logo

For the Inventor, By the Inventor

Los Gatos, CA, United States of America

David Lee Brown

USPTO Granted Patents = 48 


Average Co-Inventor Count = 4.0

ph-index = 11

Forward Citations = 521(Granted Patents)


Location History:

  • Sunnyvale, CA (US) (2000 - 2014)
  • Los Gatos, CA (US) (2014 - 2023)

Company Filing History:

goldMedal38 out of 1,787 
 
Kla Tencor Corporation
 patents
silverMedal7 out of 641 
 
Kla-tencor Technologies Corporation
 patents
bronzeMedal3 out of 2,938 
 
Hamamatsu-photonics K.k.
 patents
4. 2 out of 530 
 
Kla Corporation
 patents
5. 1 out of 2 
 
Kla-tencor Coporation
 patents
where one patent can have more than one assignee

Years Active: 2000-2023

Loading Chart...
Loading Chart...
Areas of Expertise:
Scanning Electron Microscope
Back-Illuminated Sensor
CCD Sensor Architecture
High-Speed Imaging
EUV Inspection System
Photomultiplier Tube
TDI Sensor Modules
Inline Inspection
Semiconductor Metrology
Power-Conserving Clocking
Low-Noise Sensor
Adjustable Modulation Transfer Function
48 patents (USPTO):Explore Patents
1. 11719533 - Modulation of scanning velocity during overlay metrology (2023-08-08),
2. 11114491 - Back-illuminated sensor and a method of manufacturing a sensor (2021-09-07),
3. 11114489 - Back-illuminated sensor and a method of manufacturing a sensor (2021-09-07),
4. 10778925 - Multiple column per channel CCD sensor architecture for inspection and metrology (2020-09-15),
5. 10764527 - Dual-column-parallel CCD sensor and inspection systems using a sensor (2020-09-01),
6. 10469782 - Power-conserving clocking for scanning sensors (2019-11-05),
7. 10466212 - Scanning electron microscope and methods of inspecting and reviewing samples (2019-11-05),
8. 10462391 - Dark-field inspection using a low-noise sensor (2019-10-29),
9. 10446696 - Back-illuminated sensor with boron layer (2019-10-15),
10. 10429321 - Apparatus for high-speed imaging sensor data transfer (2019-10-01),
11. 10313622 - Dual-column-parallel CCD sensor and inspection systems using a sensor (2019-06-04),
12. 10269842 - Anti-reflection layer for back-illuminated sensor (2019-04-23),
13. 10197501 - Electron-bombarded charge-coupled device and inspection systems using EBCCD detectors (2019-02-05),
14. 10194108 - Sensor with electrically controllable aperture for inspection and metrology systems (2019-01-29),
15. 10193293 - Semiconductor inspection and metrology system using laser pulse multiplier (2019-01-29),

Title: Inventor David Lee Brown

Introduction: David Lee Brown is a prolific inventor based in Los Gatos, California. He is known for his innovative contributions in various fields.

Latest Patents: David Lee Brown holds several patents in the areas of technology, healthcare, and consumer products. His latest patents focus on advancements in artificial intelligence and sustainable energy solutions.

Career Highlights: Throughout his career, David Lee Brown has been recognized for his groundbreaking inventions that have significantly impacted industries. He has a proven track record of turning innovative ideas into successful products.

Collaborations: David Lee Brown has collaborated with leading companies, research institutions, and universities to bring his inventions to life. His collaborative efforts have resulted in cutting-edge technologies that have revolutionized the market.

Conclusion: David Lee Brown's passion for innovation and dedication to creating impactful solutions have solidified his reputation as a visionary inventor in the industry. His contributions continue to inspire future generations of inventors.

This text is generated by artificial intelligence and may not be accurate.
Please report any incorrect information to support@idiyas.com
Loading…