The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 04, 2019

Filed:

Oct. 28, 2016
Applicant:

Kla-tencor Corporation, Milpitas, CA (US);

Inventors:

Yung-Ho Alex Chuang, Cupertino, CA (US);

Jingjing Zhang, San Jose, CA (US);

Sharon Zamek, Sunnyvale, CA (US);

John Fielden, Los Altos, CA (US);

Devis Contarato, San Carlos, CA (US);

David L. Brown, Los Gatos, CA (US);

Assignee:

KLA-Tencor Corporation, Milpitas, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/378 (2011.01); G01N 21/95 (2006.01); G06T 7/00 (2017.01); H01L 27/148 (2006.01); H04N 5/372 (2011.01); H04N 5/361 (2011.01);
U.S. Cl.
CPC ...
H04N 5/378 (2013.01); G01N 21/9501 (2013.01); G06T 7/0008 (2013.01); H01L 27/14812 (2013.01); H01L 27/14825 (2013.01); H04N 5/361 (2013.01); H04N 5/372 (2013.01); G06T 2207/30148 (2013.01);
Abstract

A dual-column-parallel image CCD sensor utilizes a dual-column-parallel readout circuit including two pairs of cross-connected transfer gates to alternately transfer pixel data (charges) from a pair of adjacent pixel columns to a shared output circuit at high speed with low noise. Charges transferred along the two adjacent pixel columns at a line clock rate are alternately passed by the transfer gates to a summing gate that is operated at twice the line clock rate to pass the image charges to the shared output circuit. A symmetrical Y-shaped diffusion is utilized in one embodiment to merge the image charges from the two pixel columns. A method of driving the dual-column-parallel CCD sensor with line clock synchronization is also described. A method of inspecting a sample using the dual-column-parallel CCD sensor is also described.


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