This inventor holds 38 USPTO granted patents and 2 published patent applications, primarily in Surface Inspection Systems. Top assignees: Kla Tencor Corporation, Kla-Tencor Technologies Corporation, Kla Corporation. Active years: 2006-2023.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Location History:
- Cambell, CA (US) (2012)
- Campbell, CA (US) (2006 - 2019)
- San Jose, CA (US) (2012 - 2023)
Company Filing History:
23 out of 1,787 
14 out of 641 
1 out of 619 
Years Active: 2006-2023
Areas of Expertise:
Title: Christian Wolters: Innovator in Optical Surface Defect Characterization
Introduction
Christian Wolters, based in Campbell, CA, is a prolific inventor with an impressive portfolio of 38 patents. His innovative work primarily focuses on optical surface defect characterization, paving the way for advancements in materials science and inspection technologies.
Latest Patents
Among his latest patents, Wolters has developed methods and systems for optical surface defect material characterization. This technology includes detecting and classifying defects based on the phase of dark field scattering from a sample. The invention enables increased throughput by utilizing a single optical system to both detect and classify defects. This involves a novel approach in which defects are classified according to the measured relative phase of scattered light from multiple spatially distinct locations.
Another significant patent is related to surface defect inspection with large particle monitoring and laser power control. This system innovatively reduces illumination intensity while scanning, enhancing the detection of large particles. The method utilizes a primary and leading measurement spot to determine the presence of large particles, thereby minimizing the risk of damage or erroneous measurement during inspection.
Career Highlights
Throughout his career, Christian Wolters has contributed significantly to companies like KLA-Tencor Corporation and KLA-Tencor Technologies Corporation. His work within these organizations has influenced the development of technologies that improve the efficiency and accuracy of materials inspection.
Collaborations
Wolters has collaborated with notable professionals in the field, including Anatoly Romanovsky and Stephen Biellak. Their combined expertise has helped foster advancements in optical technologies and defect characterization, contributing to the broader engineering and scientific community.
Conclusion
Christian Wolters stands out as a key figure in the realm of optical surface defect characterization. With numerous patents to his name, his contributions continue to shape the future of inspection technologies, providing essential tools for quality control in various industries. His innovative approaches serve as a testament to the impact of dedicated inventors in enhancing material sciences.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile