Tainan, Taiwan

Chin-I Liao

USPTO Granted Patents = 33 

Average Co-Inventor Count = 2.9

ph-index = 8

Forward Citations = 139(Granted Patents)


Company Filing History:


Years Active: 2009-2017

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33 patents (USPTO):Explore Patents

Title: Innovations and Contributions of Chin-I Liao in Semiconductor Technology

Introduction

Chin-I Liao is a distinguished inventor based in Tainan, Taiwan, recognized for his substantial contributions to semiconductor technology. With an extensive portfolio of 33 patents, he has made significant advancements that enhance the performance and efficiency of electronic devices.

Latest Patents

Among his latest patents, Liao has developed cutting-edge technologies such as the "Fin Field Effect Transistor and Method for Fabricating the Same" and a "Semiconductor Structure Having Enlarged Regrowth Regions and Manufacturing Method of the Same." The FinFET innovation incorporates a substrate with multiple fins, isolators, and a gate stack, designed to improve the handling of electronic signals. His semiconductor structure features a distinctive regrowth region, optimizing the source/drain capabilities and thus elevating the overall performance of semiconductor devices.

Career Highlights

Chin-I Liao has held significant positions in leading companies in the semiconductor industry, including United Microelectronics Corporation and Taiwan Semiconductor Manufacturing Company Ltd. His work in these organizations reflects his commitment to pushing the boundaries of technology and innovation in semiconductor fabrication.

Collaborations

Throughout his career, Liao has collaborated with prominent professionals in his field, such as Chin-Cheng Chien and Shih-Chieh Chang. These partnerships have fostered an environment of creativity and have contributed to the successful development of his innovative patents.

Conclusion

Chin-I Liao’s relentless pursuit of innovation in semiconductor technology illustrates his critical role as an inventor in this field. His numerous patents not only underscore his contributions but also pave the way for future advancements in electronic device efficiency and performance.

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